Unlock instant, AI-driven research and patent intelligence for your innovation.

Method for identifying conducting particle indentations

A technology of conductive particles and indentation, which is applied in character and pattern recognition, instruments, computer parts, etc., can solve problems such as unsatisfactory recognition accuracy, achieve the effects of increasing production capacity, improving accuracy, and reducing labor costs

Active Publication Date: 2015-03-25
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
View PDF5 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] An exemplary embodiment of the present invention is to provide a method for identifying conductive particle indentations, so as to overcome the problem of unsatisfactory identification accuracy in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for identifying conducting particle indentations
  • Method for identifying conducting particle indentations
  • Method for identifying conducting particle indentations

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like numerals refer to like parts throughout. The embodiments are described below in order to explain the present invention by referring to the figures.

[0022] figure 1 A flowchart illustrating a method for identifying conductive particle indentations according to an exemplary embodiment of the present invention.

[0023] Such as figure 1 As shown, in step S10, an image of the substrate of the TFT-LCD to be inspected is collected.

[0024] Images of the substrate of the thin film transistor liquid crystal display can be captured using various suitable image capture devices. For example, an industrial camera and a differential interference phase contrast microscope can be combined to collect images of the substrate of the thin film transistor liquid crystal display to be inspected. figure 2 An example of an image acq...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a method for identifying conducting particle indentations. The method includes the steps that (A) images of substrates of a thin film transistor liquid crystal display screen to be detected are collected; (B) image characteristics of a preset type of the collected images are extracted; (C) the extracted image characteristics of the preset type are input to a classifier which is trained in advance, so that whether the substrates of the thin film transistor liquid crystal display screen to be detected have the conducting particle indentations is determined, wherein the classifier is trained by using the image characteristics, extracted from a positive sample set and a negative sample set, of the preset type, the positive sample set comprises the images of the substrates, having the conducting particle indentations, of the thin film transistor liquid crystal display screen, and the negative sample set comprises the images of the substrates, not having the conducting particle indentations, of the thin film transistor liquid crystal display screen. According to the method, identification accuracy of the conducting particle indentations can be improved.

Description

technical field [0001] The invention relates to the technical field of thin film transistor liquid crystal display screens, and more specifically relates to a method for identifying indentations of conductive particles. Background technique [0002] Currently, thin film transistor liquid crystal displays (TFT-LCDs) have been widely used in electronic devices such as mobile communication terminals, personal computers, tablet computers, game consoles, and digital multimedia players due to their many advantages. In the production process of TFT-LCD Module, after bonding with anisotropic conductive film (ACF bonding), the existing identification of conductive particle indentation is mainly through the grayscale detection of the image of the TFT-LCD substrate or It is realized by simple gradient detection. The recognition effect of this recognition method is easily affected by factors such as illumination and focal length, and it is very easy to fail to detect or miss detection b...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/46G06K9/62
CPCG06V10/462G06F18/24
Inventor 刘晓乐迟文宏覃伟武
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD