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test sorter

A technology for testing sorting machines and test trays, which is applied in the direction of sorting, measuring electricity, measuring devices, etc., and can solve problems such as inefficient test operations and long test time

Active Publication Date: 2017-06-16
TECHWING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This can also be the reason for long test times and inefficient test operations

Method used

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Examples

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Embodiment Construction

[0032] Hereinafter, the embodiments of the present invention will be described with reference to the drawings, but the content related to the related art that has been described will be omitted or compressed in the description.

[0033] Image 6 It is a plan view showing a test sorting machine according to an embodiment of the present invention.

[0034] The test sorting machine 600 according to this embodiment may include a test tray 610, a loading device 620, a soaking chamber 630, a test chamber 640, a pushing device 650, a de-soaking chamber 660, and an unloading device 670. The test tray 610, the loading device 620, the soaking chamber 630, the test chamber 640, the pushing device 650, the de-soaking chamber 660, and the unloading device 670 have been described in the background art, so their description will be omitted.

[0035] Such as Figure 7 As shown in detail in this embodiment, the substrate 680 may be formed with two loading holes 681 and four unloading holes 682. In a...

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PUM

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Abstract

The present invention relates to a test handler. According to the invention, the test handler enables a loading face of a consumer tray to be inserted into or pass through a loading hole or an unloading hole of a substrate. Therefore, the lifting distance of a loading device or an unloading device is shortened, so that the time consumed by a loading operation or an unloading operation is reduced.

Description

Technical field [0001] The invention relates to a test sorting machine for testing semiconductor devices. Background technique [0002] The test sorting machine is a device that sorts semiconductor devices based on test results tested in a tester to which semiconductor devices manufactured through a predetermined manufacturing process are electrically connected. [0003] The test sorting machine has been disclosed through a number of patent documents, for example, Korean Patent Publication No. 10-2007-0021357 entitled "TEST HANDLER" (hereinafter referred to as the prior art). [0004] The test sorting machine supports the semiconductor devices to be tested in the following manner: the semiconductor devices are moved from the user tray to the test tray, and then the semiconductor devices loaded on the test tray are electrically connected to the tester to ensure the progress of the test. The tested semiconductor device is moved back to the empty user tray. [0005] figure 1 It is a pla...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B07C5/00
CPCB07C5/02B07C5/362G01R31/2601G01R31/2867
Inventor 李秀晶金南亨
Owner TECHWING CO LTD