Optical excitation and ultrasonic excitation combined infrared nondestructive testing device

Abstract

The invention discloses an optical excitation and ultrasonic excitation combined infrared nondestructive testing device. The device comprises a computer, a control cabinet, an excitation system and an infrared thermal imager, wherein the computer is connected with the infrared thermal imager and the control cabinet respectively; the computer is used for controlling the testing process and analyzing the testing result; the control cabinet is connected with the computer, the excitation system and the infrared thermal imager respectively; the control cabinet is used for controlling signal conversion and providing a power supply required by the excitation system; the excitation system is used for applying optical excitation and ultrasonic excitation to a tested sample; the infrared thermal imager is used for recording the temperature field change of a tested surface. In combination of the testing result obtained in different excitation manners, the defect testing accuracy and sensitivity are improved, the defect of poor detectability in a single excitation mode is overcome, false testing and missing testing are reduced, and the infrared nondestructive testing application range is enlarged.

Description

Technical field [0001] The invention belongs to the field of non-destructive testing, and in particular relates to an infrared non-destructive testing device excited by light and ultrasound. Background technique [0002] Infrared thermal wave non-destructive testing technology is an emerging non-destructive testing technology developed at the end of the last century. It applies thermal wave excitation to the test piece, and the test piece absorbs the excitation energy and conducts it into the test piece. When the test piece has defects, Due to the different thermal characteristics of the defect location and the material of the test piece, the distribution of the temperature field on the surface of the test piece is abnormal. The infrared thermal imaging system is used to identify and analyze the abnormal temperature field to achieve the purpose of detecting defects. Compared with conventional non-destructive testing methods, it is very suitable for detecting and monitoring the de...

AI Technical Summary

Problems solved by technology

However, there are also some shortcomings. In the pulsed flash thermal excitation mode, the excitation energy and excitation time are short, the detectable depth is limited, and deep internal damage cannot be found; the shape of the specimen is high, which is not conducive to the detection of thicker and test pieces with complex shapes, etc.

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