Lattice structure tester probe bay protection structure
A lattice structure and protection structure technology, applied in the field of lattice structure testing machine probe socket protection structure, can solve the problems of adsorption of debris, easy residue, damage, etc., to maintain the shape and service life, prevent The effect of chemical corrosion and cable damage prevention
Inactive Publication Date: 2015-05-06
SUZHOU ZZH INTPROP SERVICES
7 Cites 2 Cited by
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Abstract
The invention discloses a lattice structure tester probe bay protection structure. The protection structure comprises a bay body, the body comprising a bay insertion slot, the body attachment and the cable around the hook portion, the insertion slot is located in bay central body, the insert holder into the slot comprises an upper frame guide the probe tip is inserted vertebral station slot, the middle and lower part of the escape groove metal rings connected in turn, the lattice structure of the test probe tester is inserted into the slot in the bay, test probe cable or wire in the cable can be wrapped or wrapped around the hook portion. The invention is capable of full-lattice structure to protect the fragile tester probes, including the prevention of collision, hit, rub, plug and other mechanical damage, to prevent the probe cable damage, to prevent the probe chemical corrosion, prevent galvanic corrosion probe substantially maintain the shape and the life of the probe.
Application Domain
Electrical measurement instrument detailsElectrical testing
Technology Topic
Wrap aroundTest probe +2
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PUM
Property | Measurement | Unit |
Thickness | 12.0 ~ 25.0 | µm |
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