A fault arc detection method for photovoltaic systems under abnormal lighting conditions

A technology of abnormal illumination and fault arc, applied in the monitoring of photovoltaic systems, photovoltaic power generation, photovoltaic modules, etc., can solve problems such as refusal to operate, and achieve the effects of enhancing reliability, widening the scope, and avoiding loss of life and property

Active Publication Date: 2017-04-26
CHANGSHU SWITCHGEAR MFG CO LTD (FORMER CHANGSHU SWITCHGEAR PLANT)
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Problems solved by technology

[0005] The purpose of the present invention is to solve the problem of refusal to operate caused by failure of the original set threshold value of the DC fault arc protection device when the photovoltaic system enters abnormal lighting conditions, and provides a photovoltaic system fault arc detection method under abnormal lighting conditions

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  • A fault arc detection method for photovoltaic systems under abnormal lighting conditions
  • A fault arc detection method for photovoltaic systems under abnormal lighting conditions
  • A fault arc detection method for photovoltaic systems under abnormal lighting conditions

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Embodiment Construction

[0036] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0037] see Figure 1a, a photovoltaic system arc fault detection method under abnormal lighting conditions: After confirming that no arc fault event occurs in the photovoltaic system, the MPPT algorithm action detection is performed, and the set threshold in the DC fault arc detection device is dynamically activated after the action Track changes in work points. By making the threshold value of judging arc fault features closely track the change curve of the system operating point adjusted by the MPPT algorithm, it is possible to deal with situations such as dynamic changes or continuous low power of fault arc detection caused by changes in illumination, and to ensure that the detection device can effectively detect the photovoltaic system at any time. The fault arc detection is completed under abnormal lighting conditions, and the interference of the...

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Abstract

The invention discloses an arc detection method for the fault of a photovoltaic system under an abnormal light condition. When an MPPT algorithm dynamic regulating system operating point is not caused by a fault arc accident, by allowing the fault arc characteristic quantity threshold value to tightly track the system operation point variation curve regulated by the MPPT algorithm, the circumstances that the fault arc detection electric quantity varies dynamically or lowers continuously caused by light change can be dealt, and the detection device can effectively detect fault arc in the photovoltaic system at any time can be ensured. According to the detection method, the fault arc detection precaution capacity of the photovoltaic system under abnormal light condition caused by changes of weather and environment is greatly improved, the misoperation problem caused by that the original set threshold value of the photovoltaic fault arc protection device is invalid is effectively solved, and the loophole that the traditional detection device is difficult to detect potential arc threats under the special situations is filled.

Description

technical field [0001] The invention belongs to the technical field of photovoltaic electrical fault detection, and specifically relates to a photovoltaic system operating point adjusted based on an inverter MPPT algorithm under abnormal lighting conditions, and a DC fault arc detection device dynamically tracks these operating points to adjust the set judgment feature value Threshold, a method for detecting arc faults in photovoltaic systems under abnormal lighting conditions. Background technique [0002] With the increasing tension of global energy and the requirements of sustainable environmental development, photovoltaic power generation, a new type of environmentally friendly renewable energy, has been more and more widely used in residential electricity and industrial and commercial fields. In photovoltaic power generation systems, arc faults are usually caused by non-operational reasons such as aging and damage of line insulation or loose connections such as junction...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H02S50/00
CPCH02S50/00Y02E10/50
Inventor 李兴文陈思磊屈建宇陈德桂
Owner CHANGSHU SWITCHGEAR MFG CO LTD (FORMER CHANGSHU SWITCHGEAR PLANT)
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