Particle granularity measuring device and method based on near-field scattering

A measuring device and near-field technology, which is applied in the direction of measuring device, particle size analysis, particle and sedimentation analysis, etc., can solve the problems of low stability, measurement of particle size easily affected by stray light, complex device, etc.

Inactive Publication Date: 2015-06-10
SOUTHEAST UNIV
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Problems solved by technology

[0004] Technical problem: In view of the disadvantages of small-angle scattering technology, such as easy to be affected by stray light, complicated device, and low stability, when measuring particle size, t...

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  • Particle granularity measuring device and method based on near-field scattering
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Embodiment Construction

[0035] The present invention will be further explained below in conjunction with the accompanying drawings and specific embodiments. It should be understood that these embodiments are only used to illustrate the present invention and are not intended to limit the scope of the present invention. After reading the present invention, those skilled in the art all fall into the appended claims of the present application to the amendments of various equivalent forms of the present invention limited range.

[0036] The working principle of the present invention: the laser emits a coherent beam, and through the spatial filter, most of the stray light generated by the laser is filtered out, and then the laser is collimated by the collimating lens, and the collimated beam irradiates the solution to be measured, due to the particles Scattering occurs due to existence, and then the focal length of the lens behind the measurement area is adjusted, so that the speckle image formed by the su...

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Abstract

The invention discloses a particle granularity measuring device and a particle granularity measuring method based on near-field scattering, wherein the particle granularity measuring device based on near-field scattering comprises a laser device, a spatial filter, a collimating lens, a lens group, a CCD camera, and a computer. The laser device is used for emitting a coherent light beam; the spatial filter filters the coherent light beam emitted by the laser device and obtains a Gauss light beam; the collimating lens converts the Gauss light beam into a straight light beam; the lens unit is used for setting a focal length, and images scattered spots at a Z position from a measurement zone; the CCD camera is used for collecting a near-field scattered spot image that is imaged by the lens unit; and the computer processes the near-field scattered spot image collected by the CCD camera in order to obtain a particle granularity distribution. Comparing the prior art, the particle granularity measuring device and the particle granularity measuring method based on near-field scattering make the system equipment simple in the condition of not adding a complex device for removing the central light strength; the particle granularity measuring device and the particle granularity measuring method based on near-field scattering are able to achieve the measurements of the granularity and the distribution of the measured particles without any angle resolved detections, thereby expanding the range of the scattering angle and achieving the granularity measurement of nanometer particles.

Description

technical field [0001] The invention belongs to the technical field of particle size measurement, and in particular relates to a particle size measurement device and method based on near-field scattering. Background technique [0002] With the advancement of social civilization and the rapid development of science and technology, particle problems have attracted more and more attention in the fields of industry, agriculture, medicine, scientific research and the environment. Particle size and distribution are one of the main contents of particle measurement at present. Among the many methods for measuring particle size, the light scattering method has been given full attention due to its strong applicability, wide particle size measurement range, good measurement repeatability, fast real-time, high degree of automation and intelligence, few interference factors, and online measurement. It is currently the most widely used and most promising particle measurement technology. ...

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Application Information

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IPC IPC(8): G01N15/02
Inventor 许传龙谭浩张彪
Owner SOUTHEAST UNIV
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