Particle granularity measuring device and method based on near-field scattering

Abstract

The invention discloses a particle granularity measuring device and a particle granularity measuring method based on near-field scattering, wherein the particle granularity measuring device based on near-field scattering comprises a laser device, a spatial filter, a collimating lens, a lens group, a CCD camera, and a computer. The laser device is used for emitting a coherent light beam; the spatial filter filters the coherent light beam emitted by the laser device and obtains a Gauss light beam; the collimating lens converts the Gauss light beam into a straight light beam; the lens unit is used for setting a focal length, and images scattered spots at a Z position from a measurement zone; the CCD camera is used for collecting a near-field scattered spot image that is imaged by the lens unit; and the computer processes the near-field scattered spot image collected by the CCD camera in order to obtain a particle granularity distribution. Comparing the prior art, the particle granularity measuring device and the particle granularity measuring method based on near-field scattering make the system equipment simple in the condition of not adding a complex device for removing the central light strength; the particle granularity measuring device and the particle granularity measuring method based on near-field scattering are able to achieve the measurements of the granularity and the distribution of the measured particles without any angle resolved detections, thereby expanding the range of the scattering angle and achieving the granularity measurement of nanometer particles.

Description

technical field [0001] The invention belongs to the technical field of particle size measurement, and in particular relates to a particle size measurement device and method based on near-field scattering. Background technique [0002] With the advancement of social civilization and the rapid development of science and technology, particle problems have attracted more and more attention in the fields of industry, agriculture, medicine, scientific research and the environment. Particle size and distribution are one of the main contents of particle measurement at present. Among the many methods for measuring particle size, the light scattering method has been given full attention due to its strong applicability, wide particle size measurement range, good measurement repeatability, fast real-time, high degree of automation and intelligence, few interference factors, and online measurement. It is currently the most widely used and most promising particle measurement technology. ...

AI Technical Summary

Problems solved by technology

[0004] Technical problem: In view of the disadvantages of small-angle scattering technology, such as easy to be affected by stray light, complicated device, and low stability, when measuring particle size, the present invention proposes a near-field scattering method and device for measuring particle size that are different from traditional small-angle scattering particle size measurement technology and distribution

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