Hierarchical switch network device for testing of multiple T/R (transmitting/receiving) modules and method for implementation of hierarchical switch network for testing of multiple T/R modules

Abstract

The invention provides a hierarchical switch network device for testing of multiple T / R (transmitting / receiving) modules. By adoption of a hierarchical structure, allocation of test instrument resources is carried out inside a first-level switch network to form N groups of test instrument resources in independent use; a second-level switch network is formed by combination of test channels required by testing of the T / R modules, and test scale expansion or test object change can be realized by increase or replacement of the second-level switch network. In a test scale expansion process, the first-level switch network serving as a common part of the whole switch network is kept unchanged, existing test resources can be fully used in the test scale expansion process, and the expansion requirements on flexibility, quickness and low cost can be met; replacement of damaged switches or cables is pretty convenient and quick, convenience in maintenance and test is greatly improved, and interior complexity is evidently lowered due to splitting of the original switch network into multiple switch networks.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a hierarchical switch network device in multi-T / R component testing, and also relates to a method for realizing the hierarchical switching network in multi-T / R component testing. Background technique [0002] T / R components are generally composed of one or more transceiver channels, which are located at the RF microwave front-end of phased array electronic information equipment such as radar and electronic countermeasures, and are the most numerous and most important type of such equipment. Microwave components, which have a crucial impact on the performance of the entire equipment, are also typical representatives of the field of microwave components. In addition, from the perspective of testing, it is a type of microwave component with the most testing parameters and the most complicated testing implementation. [0003] Although the current T / R component test system can realiz...

AI Technical Summary

Problems solved by technology

Since the switch network is to be installed in the test cabinet, its internal depth is determined. Therefore, to complete the integration of the above-mentioned switches and cables, the height must be expanded. Finally, the height of the entire switch network is about 20U (1U=4.445cm), and the volume Huge, complex internal wiring relationship and difficult connection

[0006] At present, the test scale of the existing switch network based on integrated design is fixed, and it is impossible to achieve flexible and rapid expansion.

If you want to increase the test scale, you basically have to overthrow the previous design, which also brings waste of cost and cycle

In addition, the switch network required for multi-T / R component testing is often very complex and large in scale. Once a certain switch or cable fails, it is necessary to remove a large number of other irrelevant switches and cables. The workload of repair and retesting is also huge

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