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MiS capacitor structure and manufacturing method thereof

A capacitor structure and manufacturing method technology, which is applied in semiconductor/solid-state device manufacturing, circuits, electrical components, etc., to achieve low process complexity and reduce production costs

Inactive Publication Date: 2015-08-19
SEMICON MFG INT (SHANGHAI) CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Both PiP and MiM capacitors require additional reticle and additional cost

Method used

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  • MiS capacitor structure and manufacturing method thereof
  • MiS capacitor structure and manufacturing method thereof
  • MiS capacitor structure and manufacturing method thereof

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Embodiment Construction

[0028] The present invention will be further described below in conjunction with specific embodiment and accompanying drawing, set forth more details in the following description so as to fully understand the present invention, but the present invention can obviously be implemented in many other ways different from this description, Those skilled in the art can make similar promotions and deductions based on actual application situations without violating the connotation of the present invention, so the content of this specific embodiment should not limit the protection scope of the present invention.

[0029] Example of a method of fabricating a MiS capacitor structure

[0030] Figure 1 to Figure 6 It is a process flow diagram of the manufacturing process of the MiS capacitor structure according to one embodiment of the present invention. It should be noted that these drawings are only examples, they are not drawn according to the same scale, and should not be taken as limit...

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Abstract

The invention provides an MiS capacitor structure and a manufacturing method thereof. The manufacturing method comprises the steps of supplying a substrate with shallow trench isolations at two sides, defining an active region through N+ / P+ injection; depositing a shielding layer on the surface of the active region and patterning, exposing an active region between the shielding layer and the shallow trench isolation at one end; depositing a metal layer and an antireflection layer on the current structure; performing quick thermal annealing, thereby forming a leading-out end between the covered active region and the metal layer above the active region; performing spin coating of a photoresist layer and patterning, so as to etch the antireflection layer and the metal layer through utilizing the photoresist layer on a mask until the edge, the leading-out end and the shallow trench isolation are exposed; removing the photoresist layer and performing quick thermal annealing on the current structure; and depositining an interlayer medium layer above the current structure, and defining the positions of two contact holes in the current structure; wherein one contact hole is connected with the leading-out end, and the other contact hole penetrates through the antireflection layer and is connected with the metal layer. According to the MiS capacitor structure, process complexity and cost of the MiS capacitor are reduced.

Description

technical field [0001] The invention relates to the technical field of semiconductor integrated circuit manufacturing, in particular, the invention relates to a novel MiS (metal-insulator-substrate) capacitor structure and a manufacturing method thereof. Background technique [0002] In IC chips, traditional capacitors are PiP (polysilicon-insulator-polysilicon) capacitors or MiM (metal-insulator-metal) capacitors. Both PiP and MiM capacitors require additional reticles and additional costs. In order to reduce the process complexity and cost, a novel capacitor structure and manufacturing method is urgently needed. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide a novel MiS capacitor structure and a manufacturing method thereof, which can reduce process complexity and cost. [0004] In order to solve the above-mentioned technical problems, the invention provides a kind of manufacturing method of MiS capacitor st...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/02H01L29/94
Inventor 陈轶群蒲贤勇陈宗高王刚宁王海强
Owner SEMICON MFG INT (SHANGHAI) CORP
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