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FOUP structure and FOUP cleaning method

A technology of air inlet pipe and air outlet pipe, which is applied in the field of FOUP structure and FOUP cleaning, which can solve the problems of poor gas fluidity, affecting the purification effect of the upper wafer, and deterioration of FOUP purification effect, so as to achieve stable air flow and improve cleaning uniformity and cleaning efficiency

Inactive Publication Date: 2015-08-26
SHANGHAI HUALI MICROELECTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

like figure 1 As shown, there are two air inlets 21 at the bottom of the FOUP, but such a setting will cause the gas fluidity to deteriorate due to the obstruction of the upper wafer during gas purification, thereby deteriorating the purification effect of the FOUP
[0006] The prior art provides another FOUP structure, such as figure 2 As shown, two ventilation pipes 31 are arranged on the rear side of the FOUP, and the air outlet 32 ​​is arranged at the bottom of the FOUP, which will cause the airflow to flow directly to the bottom and be discharged from the air outlet, while the flow rate of the upper wafer is very small, which affects the flow of the upper wafer. Purification effect

Method used

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  • FOUP structure and FOUP cleaning method
  • FOUP structure and FOUP cleaning method
  • FOUP structure and FOUP cleaning method

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Embodiment Construction

[0025] see image 3 , the FOUP structure of this embodiment is a carrier for transporting and storing multiple wafers, and it includes a front plate 11 with an opening, a rear plate 12 opposite to the front plate, first side plates 13 on both sides and a second The side plate 14, the top plate 15 and the bottom plate 16, the front plate 11, the rear plate 12, the first side plate 13, the second side plate 14, the top plate 15 and the bottom plate 16 enclose a wafer space for placing wafers. In this embodiment, the inside of the first side plate 13 in the FOUP structure is provided with an air inlet pipe 18 extending from the bottom plate 16 to the top plate 15, and the inside of the second side plate 14 is provided with an air outlet pipe 19 extending from the bottom plate 16 to the top plate 15. The air pipe 18 is provided with a plurality of air inlets 181 from bottom to top, and the air outlet pipe is provided with a plurality of air outlets 191 from bottom to top.

[0026...

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Abstract

The invention discloses a front-opening-unified-pod (FOUP) structure and an FOUP cleaning method. An air inlet pipe and an air outlet pipe are arranged at inner sides of side plates at two sides an FOUP unit to form a unidirectional air flowing channel; and a plurality of air inlets and air outlets are formed in the air inlet pipe and the air outlet pipe from top to bottom. Therefore, the airflow can be distributed in the longitudinal space uniformly and wafers at the top and bottom of the FOUP unit can be blown; and compared with the prior art, the airflow is stable and uniform. The clean uniformity, the cleaning efficiency, and the cleaning effect of wafers in the FOUP unit can be improved.

Description

technical field [0001] The invention relates to the technical field of semiconductor related equipment and technology, in particular to a FOUP structure and a FOUP cleaning method. Background technique [0002] With the increasing integration of semiconductor elements in integrated circuits, the relative accuracy of the manufacturing process is extremely important. Because once a slight error or contamination occurs in the manufacturing process, it may cause the failure of the manufacturing process, resulting in damage or scrap of the wafer, thus consuming a lot of cost. [0003] Throughout a semiconductor fabrication facility, multiple wafers are typically transferred and stored in batches by wafer carriers between the load ports of different wafer processing tools or equipment. Such tools typically perform various processes used in IC chip fabrication, such as photolithography, etching, material / film deposition, curing, annealing, inspection, or other processes. One such...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/673B08B5/02
CPCH01L21/67393B08B5/02
Inventor 张召黄家乐王智苏俊铭倪立华
Owner SHANGHAI HUALI MICROELECTRONICS CORP
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