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Image generating device, defect inspection device, and defect inspection method

An image generation device and defect technology, which can be used in image enhancement, image analysis, measurement devices, etc., and can solve problems such as limited defect detection capabilities

Active Publication Date: 2017-05-10
SUMITOMO CHEM CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Therefore, the above-mentioned conventional defect inspection apparatus for inspecting defects of sheet-shaped molded objects using two-dimensional image data composed of a plurality of one-dimensional image data acquired by a linear sensor has only a limited defect detection capability.

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  • Image generating device, defect inspection device, and defect inspection method
  • Image generating device, defect inspection device, and defect inspection method
  • Image generating device, defect inspection device, and defect inspection method

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Embodiment Construction

[0065] figure 1 It is a process diagram which shows the process of the defect inspection method which concerns on one Embodiment of this invention. The defect inspection method of this embodiment includes: figure 1 The conveyance process s1 shown; light irradiation process s2; photographing process s3; feature value calculation process s4; processed image data generation process s5; defect information acquisition process s6; analysis image data generation process s7; image analysis process s8.

[0066] figure 2 It is a schematic diagram which shows the structure of the defect inspection apparatus 100 which concerns on one Embodiment of this invention. image 3 is a block diagram showing the structure of the defect inspection device 100 . The defect inspection device 100 of the present embodiment is a device for detecting defects in a sheet-shaped molded article 2 of thermoplastic resin or the like, and includes the image generation device 1 and the image analysis device 7 ...

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Abstract

In a defect inspection device (100), a processed image generation unit (61) of an image generation device (1) generates processed image data constituted by gradation information-storing bit strings, wherein gradation information representing gradation values corresponding to feature values for defective pixels is stored, and gradation information representing gradation values of zero for the remaining pixels is stored. An analysis image generation unit (62) generates analysis image data constituted by analysis bit strings obtained by adding defect information-storing bit strings, wherein defect information is stored, to the gradation information-storing bit strings, for each pixel.

Description

technical field [0001] The present invention relates to an image generating device for generating image data for inspecting defects of sheet-shaped molded articles such as polarizing films and retardation films, a defect inspection device having the image generating device, and a defect inspection method. Background technique [0002] Conventionally, defect inspection devices have inspected defects in sheet-shaped molded objects such as polarizing films and retardation films using a one-dimensional camera called a line sensor. A defect inspection device that scans the surface of a sheet-shaped molded object along the long-side direction of the sheet-shaped molded object with a linear sensor from one end to the other end of the long-side direction in a state where the sheet-shaped molded object is illuminated by a linear light source such as a fluorescent tube , and acquire a plurality of one-dimensional image data (still image data). Then, two-dimensional image data is gene...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/892G06T1/00
CPCG01N21/8851G01N21/8903G06T7/0004G06T2207/30124
Inventor 尾崎麻耶
Owner SUMITOMO CHEM CO LTD