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A statistical method and device for coverage

A statistical method and coverage technology, applied in the computer field, can solve the problem that the stable version of the full-chip code is difficult to achieve, and the FPGA verification cannot be used.

Active Publication Date: 2018-10-02
INSPUR BEIJING ELECTRONICS INFORMATION IND
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Problems solved by technology

However, there are two problems with this method. One is that the code version needs to be consistent for the merging of the coverage results of multiple simulations. However, in the early and middle stages of code design, because the design code is still being debugged and modified, the stability of the full-chip code version is difficult to achieve; second, such coverage statistics can only be used for simulation verification, and cannot be used for FPGA verification that is currently required to verify ultra-large-scale chips.

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  • A statistical method and device for coverage
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  • A statistical method and device for coverage

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Embodiment Construction

[0038] In order to make the purpose, technical solution and advantages of the present invention more clear, the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined arbitrarily with each other.

[0039] The steps shown in the flowcharts of the figures may be performed in a computer system, such as a set of computer-executable instructions. Also, although a logical order is shown in the flowcharts, in some cases the steps shown or described may be performed in an order different from that shown or described herein.

[0040] figure 1 Shown is the statistical method of coverage of the present invention, comprises:

[0041] Step 101: Add detection logic for detecting the coverage of the point to be covered and a register for saving the detection result for each point to...

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Abstract

The present invention discloses a method and an apparatus for carrying out statistics on a coverage rate. The method comprises: detection logics for detecting coverage conditions of points to be covered and registers for storing detection results are respectively added in a code for each point to be covered in the code; after the code is executed, the detection logics detect the coverage conditions of the corresponding points to be covered and when coverage of the corresponding points to be covered is detected, the points to be covered are recorded into the corresponding registers until execution of the code is completed; and a register value of the register corresponding to each point to be covered is respectively read and the read register values are subjected to statistical analysis to generate a coverage result of the code. According to the present invention, on the premise of ensuring structure and function implementation of a chip, the added detection logics and registers enable statistics of the coverage rate not to depend on stability of a code version and not to be sensitive for change of the code version; and the method and the apparatus can be flexibly applied to the initial and medium-term phases of code design and enable the verification work to be effectively developed as early as possible.

Description

technical field [0001] The invention relates to computer technology, in particular to a statistical method and device for coverage. Background technique [0002] With the continuous development of process technology and application fields, on the one hand, the complexity of chip design continues to increase, and on the other hand, the requirements for the chip development cycle are becoming more and more stringent. conduct. Correspondingly, as an important indicator to measure the adequacy of verification, the statistics and analysis of coverage are of great significance for controlling the verification cycle and improving verification efficiency. [0003] The traditional coverage statistics is to check the code coverage by using the coverage statistics function of the simulation tool (such as VCS, IES, etc.). However, there are two problems with this method. One is that the code version needs to be consistent for the merging of the coverage results of multiple simulations...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50
Inventor 李拓童元满李仁刚
Owner INSPUR BEIJING ELECTRONICS INFORMATION IND
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