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Method and device for measuring and optimizing optoelectronic components

A technology of optoelectronics and components, applied in the direction of electrical components, diode testing, single semiconductor device testing, etc., can solve mechanical problems, jamming and other problems, and achieve the effect of effective excitation

Active Publication Date: 2019-01-18
OSRAM OPTO SEMICON GMBH & CO OHG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The disadvantage here is that separate, in particular protruding and / or exposed contacts from the connection carrier cause mechanical problems, such as jamming, and production steps, such as galvanizing steps, are excluded

Method used

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  • Method and device for measuring and optimizing optoelectronic components
  • Method and device for measuring and optimizing optoelectronic components
  • Method and device for measuring and optimizing optoelectronic components

Examples

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Embodiment Construction

[0043] figure 1 A plan view of a first exemplary embodiment, generally designated 100 , of a connection carrier on which the method according to the invention can be applied is shown. The optoelectronic component 10 is arranged on a connection carrier 100 , for example made of metal. The connection carrier 100 comprises three connection conductor regions 12 which are arranged at regular distances from one another and each have the same structure and orientation. Each of the connecting conductor regions 12 comprises a central region 14 and first to fourth connecting conductors 16, 18, 20, 22 each having the same width, wherein the first connecting conductors 16 and Second connecting conductors 18 are each arranged on a first side of central region 14 and third connecting conductors 20 and fourth connecting conductors 22 are arranged on a second side of central region 14 opposite the first side. Between the first and second connecting conductors 16 , 18 there is respectively a...

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Abstract

A method can be used for measuring at least one optoelectronic component arranged on a connection carrier. The method includes exciting an electromagnetic oscillating circuit, which is formed by the optoelectronic component and the connection carrier, thus exciting the optoelectronic component in such a way that the optoelectronic component emits electromagnetic radiation, and measuring at least one electro-optical property of the optoelectronic component.

Description

technical field [0001] The invention proposes a method and a device for measuring optoelectronic components arranged on a connection carrier. Furthermore, a method and a device for optimizing an optoelectronic component are proposed. [0002] This patent application claims priority from German patent application 102013102322.3, the content of which is hereby incorporated by reference. Background technique [0003] According to the prior art, measurements of the optoelectronic properties of optoelectronic components are usually carried out by applying a direct voltage to the optoelectronic components. Sometimes the optoelectronic component is present, at least in the meantime, in a form in which its terminals are short-circuited, that is to say a negligible ohmic resistance is present between its terminals in the meantime. This is especially the case when the optoelectronic component is arranged on the connection carrier, for example during the production of the optoelectro...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26
CPCG01R31/2635H05B47/105G01N2201/061
Inventor 罗伯特·舒尔茨安东·沃格尔雷蒙德·奥伯施密德罗兰德·蔡塞尔迈克尔·迪策尔
Owner OSRAM OPTO SEMICON GMBH & CO OHG