Check patentability & draft patents in minutes with Patsnap Eureka AI!

Three-dimensional measurement system capable of projecting to measured object simultaneously from multiple directions

A technology of three-dimensional measurement and measured objects, which is applied in the field of three-dimensional measurement, can solve problems such as restricting applications, and achieve the effect of improving the efficiency of three-dimensional measurement and shortening the time of three-dimensional imaging

Inactive Publication Date: 2015-11-11
东莞市盟拓智能科技有限公司
View PDF7 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this way, the time overhead to complete the imaging of all fringes is several times that of using a single fringe generator, which greatly restricts the application of this technology

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Three-dimensional measurement system capable of projecting to measured object simultaneously from multiple directions
  • Three-dimensional measurement system capable of projecting to measured object simultaneously from multiple directions
  • Three-dimensional measurement system capable of projecting to measured object simultaneously from multiple directions

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0026] The three-dimensional measurement system provided by the present invention, which can simultaneously project the measured object from multiple directions, is used for three-dimensional measurement of the measured object placed on the first plane. Such as figure 1 As shown, the system includes an image analysis and control system 9, a camera 6, a first LCOS projector 4, a second LCOS projector 5, a third LCOS projector (not shown in the drawings) and a fourth LCOS projector (attached Figure not shown). Wherein, the first LCOS projector 4 , the second LCOS projector 5 , the third LCOS projector, and the fourth LCOS projector are the same, and are respectively arranged in front, rear, left, and right directions of the object 7 under test. fig...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the technical field of three-dimensional measurement, and particularly relates to a three-dimensional measurement system capable of projecting to a measured object simultaneously from multiple directions. According to the invention, four LCOS projectors are utilized to project the same sinusoidal fringes to the measured object simultaneously from the front, the back, the left and the right of the measured object, the sinusoidal fringes projected by the two LCOS projectors at the left and the right of the measured object are enabled to be overlapped through appropriately configuring the four LCOS projectors, the sinusoidal fringes projected by the two projectors at the front and the back of the measured object are also enabled to be overlapped, and the sinusoidal fringes projected by the two projectors at the front and the back of the measured objected and the sinusoidal fringes projected by the two LCOS projectors at the left and the right of the measured object are vertically crossed and overlapped. A common overlapped area of the four pieces of sinusoidal fringes is extracted in one time, and the four pieces of sinusoidal fringes in the common overlapped area can be separated according to an overlapping and orthogonality relation among the four pieces of sinusoidal fringes, thereby greatly shortening the three-dimensional imaging time, and improving the three-dimensional measurement efficiency.

Description

technical field [0001] The invention relates to the technical field of three-dimensional measurement, in particular to a three-dimensional measurement system capable of simultaneously projecting a measured object from multiple directions. Background technique [0002] At present, the 3D micro-measurement system using structured light, whether it is Moiré fringe or digital fringe, the fringe is modulated by phase shift, using sine wave, and a waveform is moved several times to complete. According to the measurement range and accuracy requirements, the general phase shift is 3 times, 4 times or 6 times. At the same time, in order to solve the problem of shadowed parts (causing measurement blind spots) when measuring objects with varying heights, all 3D micro-measurement systems using structured light will project streaked light in different directions. For example, use 2 for left and right, 4 for front, back, left and right, or even 8. [0003] The following are examples of ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B11/25
Inventor 陈昌科
Owner 东莞市盟拓智能科技有限公司
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com