Grating strip phase solving method used for three-dimensional measurement

A grating fringe and phase solution technology, which is applied in the field of optical measurement, can solve problems such as inapplicability, long measurement period, and sensitive object movement, and achieve the effect of reducing the number of fringes and improving the measurement speed

Inactive Publication Date: 2015-11-11
NANJING UNIV OF SCI & TECH
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Problems solved by technology

The advantage of this type of method is that the measurement accuracy is high, but the disadvantage is that the measurement cycle is long, and due to the characteristics of contact measurement, it is not suitable for detecting objects with soft surfaces.
These methods are still sensitive to object motion due to the large number of fringe frames used.

Method used

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  • Grating strip phase solving method used for three-dimensional measurement
  • Grating strip phase solving method used for three-dimensional measurement
  • Grating strip phase solving method used for three-dimensional measurement

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Embodiment

[0055] Generate four grating fringes I according to step one of the present invention 1 ~I 4 , Four grating fringes I 1 ~I 4 Such as figure 2 Shown. figure 2 Where (a) is the first grating fringe I generated 1 , (B) is the second grating stripe I generated 2 , (C) is the generated third grating fringe I 3 , (D) is the fourth grating stripe I generated 4 . When generating four grating fringes I 1 ~I 4 When, the parameters are set as: A(x,y)=B(x,y)=127.5, F is 10, and W is 640. Then simulate, the measured object is two blocks with different heights. According to the second step of the present invention, the four grating stripes are projected onto two squares with different heights, that is, the object under test used in this embodiment. Collect four fringe images modulated on the surface of the object to be measured, such as image 3 As shown, (a) is the first fringe image (b) is the second fringe image (c) is the third stripe image (d) is the fourth fringe image Using the ...

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Abstract

The invention provides a grating strip phase solving method used for three-dimensional measurement. The method comprises the steps that a four-amplitude grating strip is generated by a computer; a projector is used to transmit the generated four-amplitude grating strip to the surface of an object to be measured, and a camera is used to synchronously shoot a four-amplitude strip image modulated by the object to be measured; according to the four-amplitude strip image, two different phases in the four-amplitude grating strip are solved; and phase unwrapping is carried out to acquire an absolute phase of three-dimensional reconstruction. According to the invention, simply through the light stripe in a four-amplitude structure, phase solving and unwrapping can be carried out.

Description

Technical field [0001] The invention belongs to the technical field of optical measurement, and particularly relates to a method for solving the phase of grating fringes for three-dimensional measurement. Background technique [0002] Three-dimensional measurement is the process of using certain means and methods to scan the object to be measured to obtain the geometric coordinate position of its surface space. Traditional methods usually use three-dimensional coordinate machines to extract three-dimensional contours of objects. The advantage of this type of method is that the measurement accuracy is high, but the disadvantage is that the measurement period is long, and because of its contact measurement characteristics, it is not suitable for detecting objects with soft surfaces. The optical three-dimensional measurement method is a non-contact three-dimensional measurement method, which can not only measure objects non-contact, but also has high measurement efficiency and fast...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
Inventor 陈钱冯世杰顾国华左超张玉珍陶天阳张良孙佳嵩胡岩张佳琳
Owner NANJING UNIV OF SCI & TECH
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