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Terahertz receiver noise temperature test system and method

A technology of noise temperature and test system, applied in the field of terahertz, which can solve the problem of asynchronous test frequency

Inactive Publication Date: 2015-12-23
INST OF ELECTRONICS ENG CHINA ACAD OF ENG PHYSICS
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

Therefore, it is not difficult to see that there are inherent defects in using this traditional test method to test the performance of the device. Test with a fixed local oscillator signal, and the noise temperature test is a fixed intermediate frequency, there will be a phenomenon that the test frequency is not synchronized

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  • Terahertz receiver noise temperature test system and method

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Embodiment Construction

[0042] Such as figure 1 As shown, a noise temperature test system suitable for a terahertz receiver includes an intermediate frequency link and a power meter. The output end of the intermediate frequency link is connected to the detection port of the power meter; the intermediate frequency link includes an attenuator (Attenuator), isolation Isolator, amplifier module (Amplifers), band-pass filter (BPF) and cables. The input end of the attenuator is connected to the intermediate frequency signal port of the terahertz receiver to be detected through the cable, and the output end of the attenuator is connected to the The input terminal of the isolator, the output terminal of the isolator is connected to the input terminal of the amplifying module through a cable, the output terminal of the amplifying module is connected to the input terminal of the band pass filter through a cable, and the output terminal of the band pass filter is connected to the power through a cable meter.

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Abstract

The invention discloses a terahertz receiver noise temperature test system and method. The system comprises an intermediate frequency link and a power meter. The output end of the intermediate frequency link is connected with the detection port of the power meter. The intermediate frequency link comprises an attenuator, an isolator, an amplifier module and a band-pass filter. The input end of the attenuator is connected with the intermediate frequency signal port of a terahertz receiver to be detected. The output end of the attenuator is connected with the input end of the isolator. The output end of the isolator is connected with the input end of the amplifier module. The output end of the amplifier module is connected with the input end of the band-pass filter through a cable. The output end of the band-pass filter is connected with the power meter. According to a test result, the double-sideband conversion loss and the double-sideband equivalent noise temperature of a mixer are calculated. According to the invention, local frequency is adjusted through a fixed intermediate frequency; the problems of unsynchronized test frequency and test errors can be avoided; and physical characteristic changes caused by the fact that the entire system cannot continuously work under a traditional test method are avoided.

Description

Technical field [0001] The invention belongs to the technical field of terahertz, and particularly relates to a noise temperature test system and method suitable for a terahertz receiver. technical background [0002] As the working frequency band of coherent detectors rises to terahertz, one of the core problems to be solved is how to completely calibrate the performance of the device in this frequency band. The traditional and mature test method is to put the conversion loss and noise temperature of the device under different systems and conditions. The conversion loss test is through the frequency multiplication link, or directly fed by the RF signal output from the signal source, and then passed The spectrum analyzer or power meter detects the intermediate frequency signal, and then calculates the power difference. The noise temperature test principle is to use the Y factor method to test, the Y factor is the receiver under different load temperature environments (usually ho...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/29
Inventor 缪丽何月陆彬钟伟黄昆李惠萍邓贤进成彬彬
Owner INST OF ELECTRONICS ENG CHINA ACAD OF ENG PHYSICS
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