Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Self-adaptive control method and system oriented to fast scan of image with optimal quality

An adaptive control and fast scanning technology, applied in the field of image processing, can solve problems such as inability to establish mathematical models, low efficiency, complex detection and control, etc.

Active Publication Date: 2016-01-06
SHENZHEN UNIV
View PDF5 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The technical problem to be solved by the present invention is to provide an adaptive control method and system for fast scanning of images with the best quality, aiming to solve the problem of complex detection and control of the existing scanning image quality control system, low efficiency, and the inability to establish a suitable mathematical model The problem

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Self-adaptive control method and system oriented to fast scan of image with optimal quality
  • Self-adaptive control method and system oriented to fast scan of image with optimal quality
  • Self-adaptive control method and system oriented to fast scan of image with optimal quality

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0037] Adaptive control based on artificial neural network optimal image scanning method and technology is a method to control complex nonlinear systems. The image is scanned by the machine vision system and the comprehensive evaluation index of image quality is calculated, and the neural network controller is used to control the quality of the scanned image. The factors are controlled to obtain the best scanned image for subsequent image processing.

[0038] Principle of Adaptive Control System for Rapid Scanning of Optimum Quality Images

[0039] The adaptive control system for fast scanning of ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention is applicable to the field of image processing and provides a self-adaptive control method. The self-adaptive control method comprises the steps: A, setting interactive interface parameters, and configuring an expected image quality comprehensive evaluation index and a threshold condition; B, calculating image scanning quality affecting factor parameters according to the expected image quality comprehensive evaluation index; C, according to the factor parameters, scanning an image to obtain a scanned image and pre-processing the scanned image to obtain a post-scanning image; D, calculating the post-scanning image and a corresponding standard image to obtain an image quality comprehensive evaluation index; E, comparing the image quality comprehensive evaluation index with the expected image quality comprehensive evaluation index to obtain an optimal scanning factor parameter; F, scanning the image according to the optimal scanning factor parameter. According to the self-adaptive control method, a complex nonlinear system can be controlled to scan the image, to calculate the image quality comprehensive evaluation index, and to control the image scanning quality affecting factor parameters, thereby obtaining an optimal scanned image which is applied to the following image processing.

Description

technical field [0001] The invention belongs to the field of image processing, in particular to an adaptive control method and system for fast scanning of images with the best quality. Background technique [0002] The biggest feature of the widely used scanning image quality control system at present is that the detection and control are complicated and the efficiency is low. Sometimes it is necessary for the operator to observe the scanning image to judge how to carry out the scanning image quality control, which is very random. In addition, controlling the scanning image quality is a typical nonlinear system with multivariable and distributed parameters. The scanning process is very complicated, and it is difficult to establish a suitable mathematical model for it. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide an adaptive control method and system for fast scanning of images with the best quality, aiming to ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04N1/00H04N1/04
CPCH04N1/00005H04N1/04
Inventor 程涛孙高磊
Owner SHENZHEN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com