Method for extracting complex refractive index of solid sheet based on terahertz reflectance spectrum
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- BEIJING NORMAL UNIVERSITY
- Publication Date
- 2016-02-03
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The present application relates to the fields of photonics technology and electronics technology, and in particular to a method for extracting the complex refractive index of solid flakes based on terahertz reflection spectrum. Background technique
[0002] Terahertz waves generally refer to electromagnetic radiation with a frequency in the range of 0.1 THz to 10 THz (1 THz = 1012 Hz) and a wavelength in the range of 3 mm to 30 μm. Terahertz waves are located between millimeter waves and infrared rays on the electromagnetic spectrum, and belong to the far-infrared band. The position of the terahertz frequency band in the electromagnetic spectrum is as follows: figure 1 As shown, it is the transition area between photonics technology and electronic technology, macroscopic and microcosmic. Terahertz radiation has very important scientific value, and has become a worldwide research hotspot, and is one of the most advanced fields of scientific research in...