Unlock instant, AI-driven research and patent intelligence for your innovation.

A wave-type overall machine gain distribution method for a spectrum analyzer

A technology of spectrum analyzer and distribution method, which is applied in the field of wave-type overall machine gain distribution, can solve problems such as inability to improve gain compression, large gain distribution error, and measurement error, so as to improve measurement accuracy, avoid gain compression, and be easy to use Effect

Inactive Publication Date: 2018-02-06
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The advantage of this method is that each gain unit only considers its own control, there is no coupling between each other, and the algorithm and control are very simple and easy to implement; the disadvantage is that the hardware circuit resources cannot be fully utilized, the gain allocation error may be large, and when Gain compression may occur under some critical conditions when the hardware gain distribution error is large, which directly leads to measurement errors
An improvement to this scheme is to use software gain compensation to improve measurement accuracy, but this method does not improve gain compression

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A wave-type overall machine gain distribution method for a spectrum analyzer
  • A wave-type overall machine gain distribution method for a spectrum analyzer
  • A wave-type overall machine gain distribution method for a spectrum analyzer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0030] 1. Gain distribution process design

[0031] The key to gain distribution is to reduce the error generated by each gain distribution in a timely manner, which requires the gain data correction analysis technology, which is specifically completed in the hardware setting process, and its implementation process is as follows: figure 1 shown.

[0032] After each setting of a hardware unit that needs gain distribution, the gain data correction analysis module is called through a unified interface, and the result of the gain distribution is passed to the gain data correction analysis module for analysis, and the gain data correction analysis module returns the analysis at the same time Required buff distribution correction data. Each gain unit participates in the error correction of the gain, but does not participate in the comprehensive analysis wit...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a wave-type overall gain allocation method for a spectrum analyzer. The steps are as follows: analyze the gain unit in the radio frequency and intermediate frequency circuits of the spectrum analyzer, analyze the maximum gain that can be allocated by the gain unit, and then analyze the maximum gain that can be allocated according to the maximum gain that can be allocated. Gain sets the gain that needs to be allocated for each gain unit; set the first gain unit according to the gain that needs to be allocated; after setting the gain unit, start the gain data correction analysis for the set gain unit; make a decision after the analysis The gain assigned to the gain unit itself and the new gain error determined to be passed to the next gain unit; judge whether there are any gain units not set, if so, set the next gain unit, and return to the previous step; if not, end. It dynamically corrects the allocation of each gain unit, analyzes the relationship between the gain to be allocated and the hardware gain resources, tries to implement the gain allocation through hardware, avoids gain compression, and improves measurement accuracy.

Description

technical field [0001] The invention relates to a wave-type whole machine gain distribution method of a spectrum analyzer. Background technique [0002] In order to measure the signal amplitude in a wide range, the spectrum analyzer needs to adjust the internal gain distribution according to different signal amplitude measurement requirements to achieve the best measurement state. Therefore, there are multiple different and adjustable internal RF and IF circuits. The gain unit is used to realize the gain distribution. [0003] The traditional gain allocation algorithm is a parallel algorithm. The parameters of each gain unit are obtained through calibration, and the gain to be allocated to each gain unit is calculated at one time according to these parameters during allocation, and then the hardware settings of each gain unit are performed. The advantage of this method is that each gain unit only considers its own control, there is no coupling between each other, and the al...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R23/16
CPCG01R23/16
Inventor 马风军邓旭亮任水生
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP