Method for Reducing Edge Positioning Error of Optical Proximity Correction
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SEMICON MFG INT (SHANGHAI) CORP
- Publication Date
- 2019-10-25
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Abstract
Description
technical field
[0001] The invention relates to the field of semiconductor manufacturing, in particular to a method for reducing edge positioning errors of optical proximity correction. Background technique
[0002] In the semiconductor manufacturing process, the photolithography process plays a central role and is the most important process step in the production of integrated circuits. In order to overcome a series of optical proximity effects (Optical Proximity Effect, OPE) caused by the reduction of the critical dimension (CD), the industry has adopted many resolution enhancement technologies (ResolutionEnhancement Technology, RET), including optical proximity correction ( Optical Proximity Correction, OPC), Phase Shifting Mask (Phase Shifting Mask, PSM) and other technologies.
[0003] Optical proximity correction is mainly to compare the simulated graphics to be exposed with the target graphics, establish the correction mode of the graphics to be exposed, and then use...