Method for rapidly and effectively measuring importance of circuit units

A circuit unit and importance technology, applied in the field of circuit unit importance measurement based on analytical model, can solve the problems of high computational complexity, low operability, measurement accuracy, small computational complexity and operability, etc.

Active Publication Date: 2016-03-02
ZHEJIANG UNIV OF TECH
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Problems solved by technology

[0004] In order to overcome the shortcomings of insufficient measurement accuracy, excessive calculation complexity, and poor operability in the prior art, the present invention provides a fast An effective method for measuring the importance of circuit units, based on the iterative and adaptive calculation method of the EPTM model in the early stage of circuit design, to achieve high-precision, fast and effective measurement of the importance of circuit units at different levels of abstraction

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  • Method for rapidly and effectively measuring importance of circuit units
  • Method for rapidly and effectively measuring importance of circuit units
  • Method for rapidly and effectively measuring importance of circuit units

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Embodiment Construction

[0030] The present invention will be further described below in conjunction with the accompanying drawings.

[0031] refer to figure 1 and figure 2 , a fast and effective method for measuring the importance of circuit units, including the following steps:

[0032] Step 1: Netlist analysis and initialization of related quantities.

[0033] 1.1) Read the circuit netlist.

[0034] 1.2) Detect the interconnection structure between circuit units, and display the implicit series-parallel relationship. Then use the layering algorithm to layer the circuit, and extract the layer number l of the circuit c , the number of original input terminals n, the number of original output terminals m, the maximum width w of the circuit and the number N of circuit units. Then based on the binary sequence pair i ,0>Initialize the i-th circuit circuit unit g i , and extract its out degree dg i . where i=1,2,...,N.

[0035] Step 2: Calculate the gradient ε of the reliability change of the ci...

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Abstract

Provided is a method for rapidly and effectively measuring the importance of circuit units. The method comprises a step 1 of analyzing a netlist and initializing a correlative, 1.1) reading a circuit netlist, 1.2) detecting the interconnection structure between circuit units and displaying an implicit series-parallel connection relation, and layering a circuit by using a hierarchical algorithm; a step 2 of computing the reliability change gradient [epsilon] of the circuit units; a step 3 of outputting the circuit units ordered according to importance in order to use the circuit units as a design basis, 3.1) ordering the <g, [epsilon]> in an ascending order of the [epsilon], 3.2) ordering the circuit units with same [epsilon] according to the coverage rates of sensitization pathways, 3.3) successively extracting, from the <g, [epsilon]>, corresponding circuit units g to be used by a circuit designer. The method is high in measurement precision, low in computation complexity, and good in maneuverability.

Description

technical field [0001] The invention relates to the technical field of circuit reliability evaluation, in particular to a circuit unit importance measurement method based on an analytical model. Background technique [0002] As the main supporting technology of the current semiconductor industry, nano-process technology has been widely used in various high-tech fields, such as wireless sensor networks, wearable computers and implanted electronic devices. Its successful application in reality mainly depends on the miniaturization, low power consumption, intelligence of the circuit, especially the high reliability design. However, as the feature size of the device is greatly reduced, the difficulty of the processing technology increases and more defects are inevitably introduced, making the circuit reliability not only threatened by functional faults, but also challenged by parametric faults. The granular high-reliability design strategy cannot meet the miniaturization requir...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/28
Inventor 肖杰李伟杨旭华胡海根
Owner ZHEJIANG UNIV OF TECH
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