Method for rapidly and effectively measuring importance of circuit units

Abstract

Provided is a method for rapidly and effectively measuring the importance of circuit units. The method comprises a step 1 of analyzing a netlist and initializing a correlative, 1.1) reading a circuit netlist, 1.2) detecting the interconnection structure between circuit units and displaying an implicit series-parallel connection relation, and layering a circuit by using a hierarchical algorithm; a step 2 of computing the reliability change gradient [epsilon] of the circuit units; a step 3 of outputting the circuit units ordered according to importance in order to use the circuit units as a design basis, 3.1) ordering the <g, [epsilon]> in an ascending order of the [epsilon], 3.2) ordering the circuit units with same [epsilon] according to the coverage rates of sensitization pathways, 3.3) successively extracting, from the <g, [epsilon]>, corresponding circuit units g to be used by a circuit designer. The method is high in measurement precision, low in computation complexity, and good in maneuverability.

Description

technical field [0001] The invention relates to the technical field of circuit reliability evaluation, in particular to a circuit unit importance measurement method based on an analytical model. Background technique [0002] As the main supporting technology of the current semiconductor industry, nano-process technology has been widely used in various high-tech fields, such as wireless sensor networks, wearable computers and implanted electronic devices. Its successful application in reality mainly depends on the miniaturization, low power consumption, intelligence of the circuit, especially the high reliability design. However, as the feature size of the device is greatly reduced, the difficulty of the processing technology increases and more defects are inevitably introduced, making the circuit reliability not only threatened by functional faults, but also challenged by parametric faults. The granular high-reliability design strategy cannot meet the miniaturization requir...

AI Technical Summary

Problems solved by technology

[0004] In order to overcome the shortcomings of insufficient measurement accuracy, excessive calculation complexity, and poor operability in the prior art, the present invention provides a fast An effective method for measuring the importance of circuit units, based on the iterative and adaptive calculation method of the EPTM model in the early stage of circuit design, to achieve high-precision, fast and effective measurement of the importance of circuit units at different levels of abstraction

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