Automatic testing system and testing method for nonlinear thermal parameters of microwave high-power devices

An automatic test system and high-power device technology, applied in the direction of instruments, measuring electricity, measuring devices, etc., can solve the problem of time-consuming measurement, measurement results easily affected by testers, inability to achieve multi-parameter testing with one connection, and test system consumption. Time and other problems to achieve the effect of saving test cost, saving test time and speeding up test speed

Active Publication Date: 2019-01-01
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

The traditional manual test system is time-consuming and the measurement results are easily affected by the testers, so people began to study the automatic test system to obtain higher measurement accuracy
[0004] At present, people have partially realized the automatic measurement of nonlinear parameters of microwave high-power devices, but these methods all have some problems and defects. These test systems cannot realize the purpose of multi-parameter test for one connection. very strenuous

Method used

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  • Automatic testing system and testing method for nonlinear thermal parameters of microwave high-power devices
  • Automatic testing system and testing method for nonlinear thermal parameters of microwave high-power devices
  • Automatic testing system and testing method for nonlinear thermal parameters of microwave high-power devices

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Embodiment Construction

[0041] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0042] This embodiment provides an automatic test system for nonlinear thermal parameters of microwave high-power devices, including: a control circuit module and a microwave circuit module;

[0043] Wherein the control circuit module comprises microwave switches 2, 4, 5, 7, 11, YTF adjustable filter 6, 13, data acquisition card 48; data acquisition card 48 communicates with microwave switches 2, 4, 5, 7, 11 through USB serial Connect...

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Abstract

The present invention provides a kind of microwave high-power device non-linear thermal parameter automatic testing system and testing method thereof, and testing system comprises: control circuit module and microwave circuit module; Testing process is that vector network analyzer provides signal source, and then with microwave testing system Connect the relevant ports, and finally use Microsoft Visual Studio 2012 to write the MFC program to control the system control circuit part and acquire and display the instrument test data, and use Labview to write the data acquisition program for the six-port amplitude and phase test module reserved in the system. Finally, the automatic test of nonlinear thermal parameters of microwave high-power devices is realized; the present invention realizes the automatic switching of test paths, and the test system reserves interfaces for the six-port amplitude-phase test module, which reduces the cost for microwave high-power device amplitude-phase tests; In the 2G-18G wide frequency band, the goal of automatic testing of nonlinear thermal parameters of microwave high-power devices is realized, and it has the characteristics of wide frequency band, convenience, speed and accuracy.

Description

technical field [0001] The invention belongs to the application field of microwave measurement, and in particular relates to an automatic test system and a test method for non-linear thermal parameters of microwave high-power devices (high-power microwave devices). Background technique [0002] Microwave high-power devices are an extremely important class of electric vacuum electronic devices, which are widely used in satellite communications, radar and electronic countermeasures and play an important role. As a high-power device, its characteristics can be described by some technical parameters. To evaluate whether a microwave high-power device is qualified or whether it can meet its own application requirements, you can use its technical parameters as a reference. Microwave high-power devices are mainly aimed at amplifying high-frequency signals. The measurement of its technical parameters is designed to use a variety of microwave measurement techniques and high-end instr...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 高勇李恩高冲刘天恒郑虎郭高凤张云鹏
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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