Automatic testing system and testing method for nonlinear thermal parameters of microwave high-power devices
An automatic test system and high-power device technology, applied in the direction of instruments, measuring electricity, measuring devices, etc., can solve the problem of time-consuming measurement, measurement results easily affected by testers, inability to achieve multi-parameter testing with one connection, and test system consumption. Time and other problems to achieve the effect of saving test cost, saving test time and speeding up test speed
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[0041] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.
[0042] This embodiment provides an automatic test system for nonlinear thermal parameters of microwave high-power devices, including: a control circuit module and a microwave circuit module;
[0043] Wherein the control circuit module comprises microwave switches 2, 4, 5, 7, 11, YTF adjustable filter 6, 13, data acquisition card 48; data acquisition card 48 communicates with microwave switches 2, 4, 5, 7, 11 through USB serial Connect...
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