Information processing method and electronic device

Abstract

The invention discloses an information processing method and a piece of electronic equipment. The electronic equipment is provided with a central processing unit. The method comprises the steps that accumulated operation time of the central processing unit is acquired; based on the accumulated operation time of the central processing unit, a voltage adjustment strategy corresponding to the accumulated operation time of the central processing unit is determined; a second voltage is adjusted based on the determined voltage adjustment strategy, and thus a third voltage is obtained to take the place of the second voltage; and a first voltage and the third voltage are applied to a core of the central processing unit, so that hardware failure efficiency is lower than a present threshold vale when the central processing unit is operated under an ultra-frequency mode. According to the invention, ultra-frequency performance of the central processing unit can be guaranteed; and service life of the central processing unit can be prolonged.

Description

technical field [0001] The present invention relates to information processing technology, in particular to an information processing method and electronic equipment. Background technique [0002] At present, in order to reduce the probability of soft failure (Software Failure) of the central processing unit (Software Failure) in electronic equipment, and to make the central processing unit overclock to obtain greater computing performance, an additional voltage will be applied to the core of the central processing unit , However, this will increase the occurrence probability of hard failure (Hardware Failure) that is similar to electronic drift and other physically irreversible damage to the silicon element inside the central processing unit, which will affect the service life of the central processing unit. [0003] The related technology adopts the Monte Carlo method (Monte Carlo method) simulation experiment to simulate the following data in the service cycle of the cent...

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Problems solved by technology

[0002] At present, in order to reduce the probability of soft failure (Software Failure) of the central processing unit (Software Failure) in electronic equipment, and to make the central processing unit overclock to obtain greater computing performance, an additional voltage will be applied to the core of the central processing unit , however, this will increase the probability of hard failure (Hardware Failure) occurring on the silicon element inside the central processing unit, which is similar to electronic drift and other physically irreversible damage, which will affect the service life of the central processing unit

[0003] The related technology adopts the Monte Carlo method (Monte Carlo method) simulation experiment to simulate the following data in the service cycle of the central processing unit: the relationship curve between the soft failure rate of the central processing unit and the core voltage of the central processing unit, the central processing unit The relationship curve between the hard failure rate and the core voltage of the central processing unit, and the relationship curve between the cumulative failure rate (the superposition of hard failure and soft failure) and the core voltage of the central processing unit; Applied voltage; however, due to the individual differences of the central processing unit, in practical applications, the above-mentioned method cannot optimize the overclocking operation of the central processing unit, and the overclocking operation time of the central processing unit for too long may cause the central The processing unit has more hard failures and is damaged

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