Infrared detection device with precorrection heterogeneity, and precorrection method of the same

Abstract

The invention discloses an infrared detection device with precorrection heterogeneity, and a precorrection method of the same. The infrared detection device with precorrection heterogeneity comprises an infrared detector, an FPGA (Field Programmable Gate Array), an A/D (Analog-Digital Conversion Chip) and a D/A (Serial Digital-Analog Conversion Chip), wherein the FPGA is connected with the infrared detector, the A/D and the D/A; the A/D is connected with the infrared detector and the D/A; the FPGA drives the infrared detector to work normally; the infrared detector observes an object output image analog signal and transmits the image analog signal to the A/D to realize quantization of sampling, and at the same time the FPGA drives the D/A to generate a waveform voltage being approximate to an infrared detector analog output signal and transmit the waveform voltage to the A/D so that the waveform voltage is used as a reference voltage for sampling; and the image analog signal is converted into a digital signal through conversion of the A/D, and then is transmitted to the FPGA, and then is output to display after being processed through image processing. The infrared detection device with precorrection heterogeneity has the advantages of correcting the heterogeneity between rows of an image on the hardware, and improving the response range of the infrared detector.

Description

technical field [0001] The invention belongs to infrared thermal imaging technology, in particular to an infrared detection device with pre-correction non-uniformity and a pre-correction method thereof. Background technique [0002] At present, the imaging display of the uncooled infrared detector is to use the analog-to-digital conversion chip A / D to sample and quantify the image analog signal output by the infrared detector to obtain the image digital signal, and then process the output display through the subsequent image algorithm. Among them, the reference voltage V of A / D sampling REF Generally, it is provided by the internal reference voltage of the A / D chip or generated by an external power chip, then V REF is a fixed value. Suppose V d is the sampling voltage range of A / D, V d It is determined by the A / D chip and is also a fixed value, so the analog input voltage range of A / D sampling: (V REF -V d / 2)~(V REF +V d / 2). However, the infrared detector has non-...

AI Technical Summary

Problems solved by technology

Although this method meets the sampling voltage range requirements of A/D, it has obvious disadvantages: 1. It reduces the quality of the original image, and the voltage division of the analog signal of the image is the reduction of the image contrast, which is not conducive to the subsequent digita

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