Test method for application program, electronic device and system

A technology of application programs and testing methods, which is applied in software testing/debugging, electrical digital data processing, error detection/correction, etc., and can solve problems such as increasing coding costs

Inactive Publication Date: 2016-05-04
BEIJING QIHOO TECH CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in order to automate, testers need to convert automated scripts for different scenarios, which increases the coding cost in the automation process
At the same time, due to the differences in the technical background of the testers and the differences in the machine environment in actual operation, the designed scenario cannot find the problems that occur on the user's machine after the product is released to the greatest extent.

Method used

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  • Test method for application program, electronic device and system
  • Test method for application program, electronic device and system
  • Test method for application program, electronic device and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0123] Considering the interaction between the first electronic device and the second electronic device, this embodiment provides a testing method for application programs, such as figure 2 shown, including:

[0124] Step S101: The first electronic device performs a traversal operation on N controls on the UI (User Interface, user interface) of the application program to be tested; wherein, the N controls are all operable controls on the UI, and N is a positive integer.

[0125] In a specific implementation process, before step S101, it further includes: installing the application program to be tested on the system of the first electronic device.

[0126] Specifically, the first electronic device can be connected to the second electronic device through a data cable, and the test script on the side of the second electronic device can obtain the installation package of the application program to be tested provided by the tester, and based on the installation package, the applic...

Embodiment approach

[0153] Mode 2.1: Based on the CPU usage data corresponding to each control in the N controls, determine whether the CPU usage rate corresponding to each control in the N controls is greater than the first preset value, and calculate the corresponding CPU usage rate in the N controls Controls greater than the first preset value are determined as abnormal controls.

[0154] For example, the first preset value may be 40%. As shown in Table 1, when the controls Con_5, Con_8, and Con_9 are operated, the CPU occupancy rates of the application program to be tested are 41%, 80%, and 90% respectively. , all exceeded the 40% standard, so the controls Con_5, Con_8, and Con_9 were determined as abnormal controls. Wherein, the first preset value can be customized by the tester, and the test script on the second electronic device side can obtain the first preset value input by the tester, and send the first preset value to the first electronic device Side test APP.

[0155] Method 2_2: Ba...

Embodiment 2

[0174] Based on the same inventive concept, considered from the side of the first electronic device, this embodiment provides a testing method for an application program, which is applied to the first electronic device, such as image 3 shown, including:

[0175] Step S201: Perform traversal operations on N controls on the user interface UI of the application to be tested; wherein, N controls are all operable controls on the UI, and N is a positive integer;

[0176] Step S202: During the traversal operation of the N controls, monitor the performance and / or stability of the application program to be tested in real time, and obtain monitoring data corresponding to each of the N controls;

[0177] Step S203: Send the monitoring data corresponding to each of the N controls to the second electronic device, so that the second electronic device can determine P out of the N controls based on the monitoring data corresponding to each of the N controls. Abnormal control, P is a positiv...

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PUM

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Abstract

The invention discloses a test method for an application program, an electronic device and a system. A traversal operation is carried out on all operable controls on a UI of the application program to be tested to simulate the actual operation condition of the application program to be tested, and the performance and / or stability of the application program to be tested is monitored in the traversal process in real time to determine an abnormal control, so that the problems occurring on user machines after product release can be discovered to the greatest extent, the problem discovery scientificity is greatly improved, the test irrationality caused by the test limitation is avoided, and meanwhile, no script conversion is carried out for a scene, so the encoding cost in an automation process is greatly reduced, and the test efficiency is greatly improved.

Description

technical field [0001] The invention relates to the technical field of software engineering, in particular to a testing method, electronic equipment and system for application programs. Background technique [0002] With the development of science and technology, there are more and more types of smart terminals. Now people can enjoy the comfortable life brought by the development of science and technology through various types of smart terminals. For example, smart terminals such as smartphones and tablet computers have become an important part of people's lives. People can use smart phones, tablet computers and other smart terminals to listen to music, watch movies, play games, surf the Internet, etc. The stress of a rhythmic life. [0003] Smart terminal, with an independent operating system, supports users to install various types of APP (Application, application program) provided by third-party service providers, such as: game APP, video APP, music APP, shopping APP, se...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F11/34
CPCG06F11/3409G06F11/349G06F11/3688
Inventor 李功文苏志海
Owner BEIJING QIHOO TECH CO LTD
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