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FLEX-based balance modem test circuit

A modem and test circuit technology, applied in the direction of electronic circuit testing, etc., can solve the problem of inability to test both the modulator and the demodulator test requirements, and achieve the effect of stabilizing the small current test function and ensuring the speed and accuracy

Inactive Publication Date: 2016-06-08
SHANGHAI PRECISION METROLOGY & TEST RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The invention aims to use the large-scale integrated circuit test system MicroFLEX to test the balance modulator / demodulator AD630, which solves the problem that the traditional devices that cannot test both modulator and demodulator test requirements realize the modulator, demodulator device testing method, and has good stability

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  • FLEX-based balance modem test circuit
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Embodiment Construction

[0016] The invention will be described in more detail below with reference to the accompanying drawings of specific embodiments of the invention. However, this invention may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.

[0017] A FLEX-based balanced modem test circuit according to an embodiment of the present invention will now be described in detail with reference to the accompanying drawings.

[0018] Such as figure 1 As shown, the test circuit according to the embodiment of the present invention includes a first operational amplifier including an amplifier, a comparator, and an integrated output amplifier; a second operational amplifier including an amplifier, a comparator, and an integrated output amplifier; and wherein the first The fi...

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Abstract

The invention relates to a FLEX-based balance modem test circuit. The test circuit comprises a first operational amplifier and a second operational amplifier, wherein the first operational amplifier comprises an amplifier, a comparator and an integrated output amplifier; and the second operational amplifier comprises an amplifier, a comparator and an integrated output amplifier. The first operational amplifier and the second operational amplifier have two different input channels respectively, and only one channel work in each time. Compared with the prior art, the test circuit of the invention has the advantages that the problem that a device with both modulator and demodulator test requirements cannot be tested traditionally is overcome, both modulator and demodulator are tested. the testing speed and precision are ensured, and a stable low-current test function is realized.

Description

technical field [0001] The invention relates to integrated circuit testing technology, in particular to a method for testing the balance modulator / demodulator AD630 used in aerospace by using the large-scale integrated circuit testing system MicroFLEX. Background technique [0002] AD630 is a balanced modulator / demodulator with a bandwidth of 2Mhz per channel, which can recover signals from 100dB noise, 1khz intermodulation interference is less than -120dB, programmable closed-loop gain ±1, ±2, closed-loop gain accuracy and matching degree 0.05%, in There are a wide range of applications in aerospace models. However, the existing technology cannot test devices with such high precision and dynamic parameter testing requirements, and cannot realize dynamic parameters, high-precision testing methods, and have good stability. [0003] The large-scale integrated circuit test system MicroFLEX has the function of high-speed and high-precision testing, and has a relatively comple...

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Application Information

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IPC IPC(8): G01R31/28
Inventor 许伟达徐导进
Owner SHANGHAI PRECISION METROLOGY & TEST RES INST