Method and system for automatically collecting and analyzing computer cluster node information

A computer cluster and node information technology, applied in transmission systems, digital transmission systems, electrical components, etc., can solve the problems of complex management and monitoring of cluster systems, time-consuming and labor-intensive system administrators, and complex infrastructure structures, so as to avoid single-point risks. , the effect of reducing workload and reducing the risk of single point of failure

Inactive Publication Date: 2016-06-15
SEMICON MFG INT TIANJIN +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] However, with the development of computer technology, IT infrastructure becomes more and more complex and difficult to manage
Adding new machines, changing network configurations, or storage devices are often complex and error-prone manual tasks
Moreover, as the scale of computer clusters in the IT infrastructure becomes larger and larger, the management and monitoring of the cluster system becomes more and more complex, and the monitoring and management of the cluster becomes more and more challenging.
Under the current situation, after the hardware nodes in the cluster system are changed, the system administrator needs to manually check the status, because the manual operation brings higher requirements to the system administrator and is prone to errors; how to effectively monitor the cluster system, Ensuring the redundancy of the cluster system has become a time-consuming and laborious task for the system administrator

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  • Method and system for automatically collecting and analyzing computer cluster node information
  • Method and system for automatically collecting and analyzing computer cluster node information
  • Method and system for automatically collecting and analyzing computer cluster node information

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Embodiment Construction

[0048] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0049] It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other.

[0050] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, but not as a limitation of the present invention.

[0051] The present invention provides a method for automatically collecting and analyzing computer cluster node ...

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Abstract

The invention relates to the technical field of manufacturing of integrated circuit chips, in particular to a computer cluster system. The method for automatically collecting and analyzing the computer cluster node information comprises the following steps: s1, acquiring all node information in a computer cluster; s2, storing node information; s3, acquiring undetected nodes from the stored node information, performing redundancy analysis on the nodes according to a corresponding detection strategy, and generating an analysis result; s4, repeating the step s3 till redundancy analysis of all the nodes is finished; and s5, judging whether a single-point risk exists in any node or not according to an analysis result, and generating a detection result. Through adoption of the method and the system, the workload of a system administrator can be effectively lowered; errors and omissions of manual input are avoided; a data basis is laid for monitoring analysis of a cluster platform; a risk of single-point failure occurring in the cluster system is lowered; and the reliability of the system is improved.

Description

technical field [0001] The invention relates to the technical field of integrated circuit chip manufacturing, in particular to a computer cluster system. Background technique [0002] Integrated circuit chip manufacturing is a very complex process, and it may take several weeks and hundreds of processes to complete the manufacture of a chip. As the development of semiconductor-related technologies has approached the limit of physical phenomena, and the requirements of customers have become increasingly diversified, the flexibility and complexity of semiconductor processes have become higher and higher. A slight error will cause great losses to the company. Therefore, information automation Technology is introduced in large numbers into semiconductor manufacturing plants. [0003] Information automation can greatly improve the management level of equipment, collect process data and statistical process control, and ensure smoother logistics control. Promote the improvement o...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04L12/24
Inventor 刘晓东姜宇征陈峰李中平
Owner SEMICON MFG INT TIANJIN
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