Method for building conducted interference coupling channel multiple linear regression model by near frequency point sampling

A multiple linear regression, conducted interference technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve the problems of small model application range, interference coupling channels without any prior knowledge, etc., to eliminate environmental noise. Effect

Active Publication Date: 2016-07-20
BEIHANG UNIV
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  • Application Information

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Problems solved by technology

The above methods all establish a circuit simulation model on the premise of a certain prior knowledge of the interference coupling channel. However, the problem is that in actual tests, there is often no prior knowledge of the interference coupling channel, and the scope of application of the model is small. The established model can only be used for this type of specific coupling channel

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  • Method for building conducted interference coupling channel multiple linear regression model by near frequency point sampling
  • Method for building conducted interference coupling channel multiple linear regression model by near frequency point sampling
  • Method for building conducted interference coupling channel multiple linear regression model by near frequency point sampling

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Experimental program
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Embodiment

[0049] In the experiment, ADS software is used to build the coupling circuit, such as figure 2 , the coupling path is composed of a pure resistance circuit, a Chebyshev low-pass filter, and 80mV Gaussian white noise. The voltage source is used to generate three pulse modulation signals as the interference source signal to simulate the interference source signal in the actual equipment under test. The simulation obtained Signal v1 simulates the mixed signal measured at the actual DUT port. The expressions of the three interferer signals are as follows:

[0050] x 1 (t)=sgn(sin(2π×f m ×t))sin(2π×f 1 ×t)

[0051] x 2 (t)=sgn(sin(2π×f m ×t))sin(2π×f 2 ×t)

[0052] x 3 (t)=sgn(sin(2π×f m ×t))sin(2π×f 3 ×t)

[0053] Among them, f m is the distance between each harmonic frequency point of the interference source signal, which is 0.2MHz, f 1 ,f 2 ,f 3is the center frequency of the signal, respectively f 1 = 8MHz, f 2 = 5.3MHz, f 3 = 3.4MHz.

[0054] Step 1. Signal...

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Abstract

The invention discloses a method for building a conducted interference coupling channel multiple linear regression model by near frequency point sampling, and belongs to a conducted electromagnetic interference coupling channel parameter modeling method for building a multiple linear regression model by using the near frequency point sampling under the condition that an interference source is known. Through a frequency segmentation method, the multiple linear regression modeling method is applied to the conducted electromagnetic interference coupling channel parameter modeling with the non-linear relationship characteristics; a multipath observation sample required to modeling in the frequency point is obtained through sampling a series of frequency point characteristics near the sampling observation frequency point. On the precise of no any coupling channel apriori knowledge, the parameter model of the coupling channel can be obtained through extracting the variable relationship of an interference source and a port test signal; the universality is realized.

Description

technical field [0001] The invention belongs to the field of electromagnetic compatibility modeling, and relates to a method for establishing a multivariate linear regression model of a conduction interference coupling channel by sampling adjacent frequency points. Background technique [0002] In the electromagnetic compatibility conducted interference emission test, there are many independent interference sources inside the device under test. The interference signals generated by these interference sources are coupled to the port under test through the coupling channel, and together form the interference signal of the port under test. If the interference emission of the device under test exceeds the standard, it needs to be improved. Under the condition that the internal interference source characteristics of the device under test are known but cannot be suppressed, only by making certain changes to the interference coupling channel can the device under test Meet the stand...

Claims

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Application Information

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IPC IPC(8): G06F17/50
CPCG06F30/367
Inventor 戴飞王顺鑫郑涛苏东林
Owner BEIHANG UNIV
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