Millimeter wave radiation brightness temperature acquisition method based on quick ray tracing

An acquisition method and ray tracing technology, which are applied in the field of millimeter wave radiation brightness temperature calculation in complex scenes, and can solve problems such as the inability of geometric models to complete ray tracing of complex targets and the influence of simulation results on authenticity.

Inactive Publication Date: 2016-09-21
HUAZHONG UNIV OF SCI & TECH
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Problems solved by technology

In the above existing technologies, for the ray tracing of complex scenes, it is difficult for CSG to establish the geometric model of complex targets and cannot complete the ray tracing of complex targets, and the Blender rendering method cannot truly simulate the multiple emission process of radiation signals in complex scenes , which will inevitably affect the authenticity of the simulation results

Method used

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  • Millimeter wave radiation brightness temperature acquisition method based on quick ray tracing
  • Millimeter wave radiation brightness temperature acquisition method based on quick ray tracing
  • Millimeter wave radiation brightness temperature acquisition method based on quick ray tracing

Examples

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Embodiment

[0040] Embodiment: realize the simulation of the millimeter wave radiation image of the target scene of the ship on the calm sea surface.

[0041] A schematic flow chart of the method for calculating the brightness temperature of millimeter-wave radiation based on fast ray tracing in an embodiment of the present invention, as shown in figure 1 As shown, the method for calculating the brightness temperature of millimeter-wave radiation based on fast ray tracing in the embodiment of the present invention mainly includes the following steps:

[0042] Step 1, establish the geometric model of the complex three-dimensional structure target, and establish the micro-facet model of the three-dimensional target by meshing, such as Figure 7 shown;

[0043] Preferably, in order to enable the micro-surface element model to accurately express the structural characteristics of the target, the surface element subdivision should be fine enough. In this example, the number of micro-surface el...

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Abstract

The invention discloses a method for acquiring the brightness temperature of millimeter-wave radiation based on fast ray tracing, which includes S1 obtaining surface microfacets of a three-dimensional target in a scene to be measured; S2 establishing an imaging plane according to the field of view range and scanning angle interval set in the scene to be measured , according to the pixel coordinates on the imaging plane and the position of the antenna receiving the scene radiation signal in the simulation, the scanning ray is obtained Traverse each pixel point in turn to obtain scanning rays in multiple observation directions; S3 obtain the radiation signal transmission path according to the microfacet and the scanning rays and adopt a ray tracing algorithm; S4 obtain the radiation signal transmission path according to the target millimeter wave emissivity and the radiation signal transmission path to obtain the brightness temperature of the millimeter-wave radiation reaching the antenna in different observation directions. The invention can efficiently and accurately obtain the brightness temperature distribution of the millimeter-wave radiation in the target scene, and provide more useful information for the research on the characteristics of the millimeter-wave radiation in complex scenes.

Description

technical field [0001] The invention belongs to the technical field of passive microwave remote sensing and detection, and more specifically relates to a method for calculating brightness temperature of millimeter-wave radiation in complex scenes based on fast ray tracing. Background technique [0002] The calculation of the brightness temperature of millimeter-wave radiation for complex scenes is a hot and difficult point in current research. For a relatively simple three-dimensional structure target, the three-dimensional geometric representation of the scene target can usually be performed by constructive solid geometry (CSG), and the geometric feature information such as the normal vector of the model surface can be directly obtained, which can conveniently analyze the millimeter wave radiation signal in the scene. Simulation calculation, the published literature includes "Image Simulation Method of Microwave Radiation Brightness Temperature of Ground Objects" in "Journa...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/00
CPCG01J5/00
Inventor 胡飞郎量贺锋程亚运戚博刘斯远何小琴
Owner HUAZHONG UNIV OF SCI & TECH
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