A guiding device on an integrated circuit detection line

Abstract

The invention discloses a guide device on an integrated circuit detection line. The guide device comprises a plurality of conveyor rollers and a rack located at two ends of the conveyor rollers, wherein a plurality of guide limiting mechanisms are fixed on the rack; each guide limiting mechanism comprises an upright post; a stud is molded at the top end of each upright post; one end of a limiting adjustment lever is inserted into each stud and a hinge shaft is inserted into and fixed to the other end of each limiting adjustment lever; one end of a tension rod is hinged with each hinge shaft and a vertically downward support shaft is molded at the other end of each tension rod; a guide roller sleeves the support shaft of the tension rod in an inserting manner; a circular groove is molded on the outer wall of the upper end of the guide roller; a baffle plate is molded on the middle part of each tension rod; a prism is inserted into each baffle plate; a limiting head is molded at the top part of each prism; a pressure spring sleeves each prism in an inserting manner; two ends of each pressure spring are pressed against the corresponding baffle plate and limiting head respectively; and each limiting head is inserted into the circular groove of the corresponding guide roller. Friction of the guide device and an integrated circuit board in the guide process is rolling friction, so that abrasion on electronic components of a tilted capacitor and the like on the integrated circuit board can be reduced.

Description

Technical field: [0001] The invention relates to the technical field of integrated circuit detection lines, and more specifically relates to a guiding device on the integrated circuit detection line. Background technique: [0002] An integrated circuit is a tiny electronic device or component. Using a certain process, the transistors, resistors, capacitors, inductors and other components required in a circuit are interconnected, and they are fabricated on a small or several small semiconductor wafers or dielectric substrates, and then packaged in a tube. , into microstructures with desired circuit functions. The integrated circuit needs to be tested during the production process. The integrated circuit detection of efficient production is tested on its detection line, and the integrated circuit board is transported to the detection station through the conveying roller. If the board enters the detection station accurately, it is required to install the existing guide device...

AI Technical Summary

Problems solved by technology

The integrated circuit needs to be tested during the production process. The integrated circuit detection of efficient production is tested on its detection line, and the integrated circuit board is transported to the detection station through the conveying roller. If the board enters the detection station accurately, it is required to install the existing guide device on the conveying roller. The existing guide device is generally a guide plate, and the integrated circuit board is corrected through the guide plate. The relative movement between the guide plate and the integrated circuit board is sliding friction. , its sliding friction may cause wear of electronic components such as capacitors on the integrated circuit board

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