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Full-automatic debugging method of microcomputer relay protection device and full-automatic debugging system thereof

A technology of microcomputer relay protection and debugging method, applied in the field of electronics, can solve the problems of cumbersome, complicated automatic test file editing and the like

Active Publication Date: 2016-11-16
ZHUHAI KEZHONG TECH
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  • Summary
  • Abstract
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  • Application Information

AI Technical Summary

Problems solved by technology

In addition, in the existing microcomputer relay protection test, it is necessary to edit different test conditions for different test objects. Most of the test systems need to conduct sub-item tests, and manually build the required test environment before the test, automatically Complicated and tedious editing of test files

Method used

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  • Full-automatic debugging method of microcomputer relay protection device and full-automatic debugging system thereof
  • Full-automatic debugging method of microcomputer relay protection device and full-automatic debugging system thereof
  • Full-automatic debugging method of microcomputer relay protection device and full-automatic debugging system thereof

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Embodiment Construction

[0061] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0062] see figure 1 , is a structural schematic diagram of a fully automatic debugging system for a microcomputer relay protection device provided by the present invention.

[0063] Such as figure 1 As shown, the fully automatic debugging system of the microcomputer relay protection device includes a debugging device 11, an auxiliary switching device 12, a microcomputer relay protection device 13, a DC power switching device 14, an AC contactor and a voltage regul...

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Abstract

The invention discloses a full-automatic debugging method of a microcomputer relay protection device and a full-automatic debugging system thereof. A test scheme matched with the tested microcomputer relay protection device is selected through identification code matching, and read-write testing, analog quantity testing, switching quantity testing and protection motion testing are performed according to the test scheme so that full-automatic relay protection test verification is realized. With application of the method that automatic quantity adding replaces manual operation of tester quantity adding, labor cost and time cost consumed by manual wiring can be reduced, the risk of error caused by repeated manual operation can be avoided, the accuracy of test data can be guaranteed, real-time fault analysis can be performed according to the test data and the test result can be timely fed back so that test result generation efficiency and reliability can be enhanced.

Description

technical field [0001] The invention relates to the field of electronic technology, in particular to a fully automatic debugging method and system for a microcomputer relay protection device. Background technique [0002] With the widespread application of microcomputer relay protection, the calibration requirements for microcomputer relay protection devices are also getting higher and higher. At present, most of the calibration is performed by controlling the input value of the device under test through a microcomputer protection calibrator and obtaining feedback to perform performance calibration. A large number of repetitive operations during the test process will take up a lot of manpower and material resources. Manual settings, Manual wiring, manual addition, manual compilation of test conditions, and manual recording and editing of data may cause errors caused by humans, which reduces the reliability of test results. At the same time, the test process must be able to ...

Claims

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Application Information

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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 胡军
Owner ZHUHAI KEZHONG TECH
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