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A test system capable of conducting electrical burn-in tests and parameter tests on optocouplers

A photoelectric coupler and test system technology, applied in the direction of instruments, measuring electronics, measuring devices, etc., can solve the problems of troublesome disassembly and assembly of photocouplers, lack of real-time parameter monitoring means, and inability to obtain device operating parameters in real time, so as to achieve simplification The effect of installation operation and test device construction, improvement of test efficiency, and simplification of test operation

Active Publication Date: 2019-01-15
THE 44TH INST OF CHINA ELECTRONICS TECH GROUP CORP
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AI Technical Summary

Problems solved by technology

[0003] In the prior art, two sets of independent devices are usually used to carry out the electric aging test and the parameter test respectively. In the specific operation, the photocoupler is generally installed on the electric aging platform to carry out the electric aging test, and the electric aging test After completion, remove the photocoupler and install it on the parameter detection device for parameter testing; since a large number of photocouplers need to be tested in the same batch, the disassembly operation of the photocoupler is very troublesome, the most important thing is , due to the independence of these two processes, during the electrical aging test, there is a lack of real-time parameter monitoring means, and it is impossible to obtain the operating parameters of the device during the electrical aging test in real time

Method used

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  • A test system capable of conducting electrical burn-in tests and parameter tests on optocouplers

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Embodiment Construction

[0020] A test system capable of performing electrical burn-in tests and parameter tests on photocouplers, characterized in that: the test system consists of a PC, a test channel gating module 1, multiple burn-in circuits 2, and multiple parameter detection The circuit 3 and the photocoupler plug board 4 are composed; the photocoupler plug board 4 is provided with a plurality of sockets, and the sockets are used for plugging into the photocoupler to be tested; the number of burn-in circuits 2 matches the number of sockets , the number of parameter detection circuits 3 is the same as the number of burn-in circuits 2;

[0021] The PC is connected to the test channel gating module 1, and the test channel gating module 1 is respectively connected to a plurality of sockets, a plurality of burn-in circuits 2 and a plurality of parameter detection circuits 3;

[0022] The test channel gating module 1 can gate the socket to the burn-in circuit 2 or the parameter detection circuit 3, an...

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Abstract

The invention relates to a testing system capable of carrying out electric burn-in testing and parameter testing on a photoelectric coupler. The testing system is composed of a PC machine, a testing channel gating module, a plurality of burn-in circuits, a plurality of parameter detection circuits and a photoelectric coupler plugging board. The testing system has the following beneficial effects: the testing system is capable of carrying out electric burn-in testing and parameter testing on a photoelectric coupler; the testing operations can be simplified; and the testing efficiency can be improved.

Description

technical field [0001] The invention relates to a photoelectric coupler performance test technology, in particular to a test system capable of performing electrical aging tests and parameter tests on the photoelectric coupler. Background technique [0002] Optocoupler is a widely used device. After the optocoupler is manufactured, it is necessary to quantitatively evaluate the performance parameters of the optocoupler to screen out unqualified products and ensure product quality; the screening process is generally passed through electrical aging tests. and parameter testing two items to complete. [0003] In the prior art, two sets of independent devices are usually used to carry out the electric aging test and the parameter test respectively. In the specific operation, the photocoupler is generally installed on the electric aging platform to carry out the electric aging test, and the electric aging test After the completion, remove the photocoupler and install it on the pa...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 黄雨新兰才伦李彦良胡伟周本军蒋东新
Owner THE 44TH INST OF CHINA ELECTRONICS TECH GROUP CORP
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