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Fuse unit circuit

A fuse unit and circuit technology, applied in information storage, static memory, instruments, etc., can solve problems such as over-burning and continuous fuse burning, and achieve the effect of avoiding continuous or over-burning of fuses

Active Publication Date: 2020-02-11
SEMICON MFG INT (SHANGHAI) CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The main purpose of the present invention is to provide a fuse unit circuit to solve the problem of continuous burning or over-burning of the fuse in the prior art when the chip process changes

Method used

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  • Fuse unit circuit
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Embodiment Construction

[0019] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0020] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0021] It should be noted that the terms "fir...

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Abstract

The invention discloses a fuse unit circuit, comprising a polysilicon fuse, a current controllable unit and a switch circuit; the current controllable unit is connected with the polysilicon fuse, the polysilicon fuse is in current communication with a power supply through the current controllable unit; the switch circuit is connected with the current controllable unit and is used for controlling the current controllable unit to control a current value of the polysilicon fuse. Through the fuse unit circuit, the problem that fuse failure or fuse overburning is easily caused upon changes in the chip technology in the prior art is solved, and the fuse failure or fuse overburning due to changes in the chip technology is avoided.

Description

technical field [0001] The invention relates to the field of chips, in particular to a fuse unit circuit. Background technique [0002] In the field of integrated chips, more and more fuses (eFuse) are widely used, and the function of eFuse is not only to repair the unit, but also to be a programmable array, and it is widely used. The unit structure of eFuse mainly stores information through whether the fuse is blown or not. The resistance of the polysilicon fuse is very small before the fuse is blown, and the resistance increases exponentially after continuous high-current blown, and the state of the fuse blown will be maintained permanently. A fuse can correspond to the value of "0" or "1" in binary. However, for a rupture mode eFuse element, the current range in which the fuse can be blown completely is relatively small. Changes in current will cause the eFuse to overheat or burn continuously. [0003] At present, in the chip manufacturing process, if the process chang...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C17/16
Inventor 王艳琴张京晶王奇峰唐华
Owner SEMICON MFG INT (SHANGHAI) CORP