Piezoelectric material parameter test method and test apparatus based on dynamic method

A piezoelectric material and parameter testing technology, applied in measurement devices, frequency measurement devices, capacitance measurement, etc., can solve the problems of cumbersome testing process, low degree of automation, single testing function, etc., so as to improve the overall work efficiency and improve the measurement accuracy. Effect

Inactive Publication Date: 2016-12-14
CHINA UNIV OF GEOSCIENCES (WUHAN)
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Problems solved by technology

[0003] At present, the piezoelectric material parameter testing devices often have a single test function and limited test parameters. For example, when measuring the resonance frequency of piezoelectric materials, the impedance parameter tester is basically used, and then other piezoelectric parameters are obtained...

Method used

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  • Piezoelectric material parameter test method and test apparatus based on dynamic method
  • Piezoelectric material parameter test method and test apparatus based on dynamic method
  • Piezoelectric material parameter test method and test apparatus based on dynamic method

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Embodiment Construction

[0045] The present invention will be further described below in conjunction with drawings and embodiments.

[0046] The invention provides a method for testing piezoelectric material parameters based on a dynamic method, referring to figure 2 and image 3 , including the following procedures:

[0047] (1) Connect the current output terminal of the DDS module to a small resistor not greater than 100Ω, and then connect it to the standard resistor in series and the piezoelectric material to be measured; use the key display screen to arbitrarily set the starting frequency and step of the frequency sweep of the DDS module Step frequency and cut-off frequency; when setting, the operation can be judged by the Key value. When Key=0, 1 and 2, it means to set the start frequency, set the step frequency and set the cut-off frequency, and press the ENTER key to start outputting frequency to perform a frequency sweep.

[0048] Since the DDS module adopts AD9850, the output of the AD985...

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Abstract

The invention relates to a piezoelectric material parameter test method and a test apparatus based on a dynamic method. A to-be-tested piezoelectric material is connected with a standard resistor in series, an impedance-frequency spectrum of the to-be-tested piezoelectric material is obtained through frequency sweep, a series connection resonant frequency fs and a parallel connection resonant frequency fp of the piezoelectric material can be calculated by change of corresponding impedance amplitudes, and the impedance value corresponding to the series connection resonant frequency is a dynamic resistance value Res of the to-be-tested piezoelectric material. A free capacitance value of the to-be-tested piezoelectric material is converted to a frequency value with a function relation by employing a 555 timer circuit, a corresponding static capacitance Cap is obtained through calculation, and the mechanical quality factor Qm can be calculated with the combination of the above four parameters.

Description

technical field [0001] The invention relates to a piezoelectric material parameter testing method and a testing device based on a dynamic method, belonging to the field of piezoelectric material parameter measurement. Background technique [0002] Piezoelectric materials play an important role in modern industry, and the continuous expansion of the application field of piezoelectric materials will inevitably require more accurate measurement of commonly used piezoelectric parameters. However, the parameters of piezoelectric materials are not only related to their composition, but also closely related to the manufacturing process. Various factors in the manufacturing process will cause its performance parameters to be affected. Therefore, the measurement of performance parameters of piezoelectric materials is of great significance. [0003] At present, piezoelectric material parameter testing devices often have a single test function and limited test parameters. For example...

Claims

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Application Information

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IPC IPC(8): G01R27/02G01R27/26G01R23/02
CPCG01R23/02G01R27/02G01R27/2605G01R27/2688
Inventor 田盛楠宋俊磊杨雪董凯锋莫文琴晋芳刘阳
Owner CHINA UNIV OF GEOSCIENCES (WUHAN)
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