Probe replacement device and method and test device

A probe and probe box technology, applied in the field of testing, can solve the problems of inaccurate test results, damage, large test errors, etc., and achieve the effects of improving test accuracy, improving replacement efficiency, and improving test efficiency

Active Publication Date: 2017-01-04
BOE TECH GRP CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Test probes are often damaged during testing, resulting in inaccurate test results, so most test equipment requires frequent probe replacement
At present, the replacement of the probe is done manually, which can easily cause the probe head to be stained with foreign matter or the position of the replaced probe is not placed accurately, resulting in a large test error during the test, which seriously affects the test. The accuracy of the results; at the same time, manual replacement of probes also makes the test efficiency low

Method used

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  • Probe replacement device and method and test device
  • Probe replacement device and method and test device
  • Probe replacement device and method and test device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0051] This embodiment provides a probe replacement device, such as figure 1 As shown, it includes a replacement mechanism 1 and an auxiliary mechanism 2. The replacement mechanism 1 is used to replace the probe 3; the auxiliary mechanism 2 is used to assist the replacement mechanism 1 to push the spare probe 3 to the replacement position.

[0052]The replacement position refers to the fixed position of the probe 3 during testing. When the probe 3 in use is damaged, the replacement mechanism 1 will replace the probe 3 at the replacement position.

[0053] By setting the replacement mechanism 1 and the auxiliary mechanism 2, the automatic replacement of the probe 3 can be realized. The automatic replacement can keep the probe 3 clean and the position is accurate during the replacement process, thereby avoiding the probe caused by manual replacement. 3 is stained with foreign matter and the position of the replaced probe 3 is inaccurate, which reduces the test error of the probe...

Embodiment 2

[0087] This embodiment provides a testing device, including the probe replacement device in Embodiment 1.

[0088] By adopting the probe replacement device in Embodiment 1, the testing equipment can realize automatic replacement of probes, thereby not only improving the testing accuracy, but also improving the testing efficiency.

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PUM

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Abstract

The invention provides a probe replacement device and method and a test device. The probe replacement device comprises a replacement mechanism for replacing a probe, and an auxiliary mechanism for assisting the replacement mechanism to push a backup probe to a replacement position. The probe replacement device realizes automatic probe replacement, by which the probe is kept clean and is placed at an accurate position in the replacement process, thereby avoiding the defects that the probe is stained with foreign matters and is not placed in the accurate position which may be caused due to manual replacement, further reducing the test error of the probe and improving the accuracy of probe test results. In addition, by automatic replacement, the efficiency of probe replacement is improved, thereby improving the efficiency of the probe test.

Description

technical field [0001] The present invention relates to the technical field of testing, in particular to a probe replacement device, a replacement method and testing equipment. Background technique [0002] At present, many display products require electrical signal testing during the production process, which inevitably requires some signal testing equipment. Most signal test equipments perform signal testing by applying a test signal to a test probe, and then manually inserting the test probe into a corresponding test position. [0003] Test probes are often damaged during testing, resulting in inaccurate test results, so most test equipment requires frequent probe replacement. At present, the replacement of the probe is done manually. Manual replacement can easily cause the probe head to be stained with foreign objects or the position of the replaced probe is inaccurate, resulting in a large test error during the test, which seriously affects the test. The accuracy of t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/073
CPCG01R1/07307
Inventor 王锦谦
Owner BOE TECH GRP CO LTD
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