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Variable frequency phase measurement principle-based femtosecond laser length measuring device and method

A technology of femtosecond laser and length measuring device, which is applied in the direction of measuring device, optical device, instrument, etc.

Active Publication Date: 2017-02-01
BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
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Problems solved by technology

[0005] The purpose of the present invention is to overcome the shortcoming that the existing femtosecond laser distance measurement method needs to fine-tune the reference arm length, and propose a femtosecond laser length measurement device and method based on the principle of frequency conversion phase measurement,

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  • Variable frequency phase measurement principle-based femtosecond laser length measuring device and method
  • Variable frequency phase measurement principle-based femtosecond laser length measuring device and method
  • Variable frequency phase measurement principle-based femtosecond laser length measuring device and method

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Embodiment Construction

[0037] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0038] like figure 1As shown, a femtosecond laser length measurement device based on the principle of frequency conversion phase measurement, including a filter (MF), a beam splitter (BS), a first plane mirror (M1), a second plane mirror (M2), a second Three plane mirrors (M3), the first angle coupling reflective prism (CM1), the second angle coupling reflective prism (CM2), the first concave reflector (CV1), the second concave reflector (CV2), focusing lens ( L), a first photodetector (PD1), a second photodetector (PD2), a first bandpass filter (FR1), and a second bandpass filter (FR2).

[0039] The specific length measurement method is as follows:

[0040] The repetition frequency f of the laser output ra The femtosecond laser of =349.789543MHz is gated and filtered by the filter MF to output pulsed light of a fixed wavelength, which goes to the re...

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Abstract

The present invention relates to a variable frequency phase measurement principle-based femtosecond laser length measuring device and method and belongs to the length measurement technical field. The device of the present invention comprises a femtosecond laser, a filter, a beam splitter, a first planar reflector, a second planar reflector, a third planar reflector, a first angularly coupling reflecting prism, a second angularly coupling reflecting prism, a first concave reflector, a second concave reflector, a focusing lens, a first photodetector, a second photodetector and the like. A fine-tuning femtosecond laser frequency comb pulse repetition frequency method is adopted to replace a reference arm adjustment process and a femtosecond laser frequency comb repetition frequency adjustment process which both require large-range mechanical motion; and the number of repetition periods is judged through solving an indefinite equation based on phase measurement results under different relatively-prime repetition frequencies, and therefore, fast distance measurement can be realized. With the device and method of the invention adopted, distance measurement can be realized without the adjustment of the length of a measuring arm required under a harsh condition that only one of repetition periods can be changed.

Description

technical field [0001] The invention relates to a femtosecond laser length measuring device and method based on the principle of frequency conversion phase measurement, belonging to the technical field of length measurement. Background technique [0002] Length measurement technology is one of the most important basic engineering technologies for human beings. The current length measurement technology using the distance measurement method mainly includes two types: time method and space method. The spatial method mainly uses various rulers to directly measure distance and describe space, such as calipers, tape measures, steel tapes, etc., with limited distance and limited accuracy. The measurement method using the wavelength of light as a ruler is the usual interferometry method, which can achieve higher measurement accuracy and longer distances. The time method mainly relies on the measurement of the time required for various fluctuations to transmit in space or media. Th...

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Application Information

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IPC IPC(8): G01B11/02
CPCG01B11/02
Inventor 梁志国武腾飞邢帅
Owner BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
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