Engine ignition capacitor aging test fault detection device

Abstract

The invention discloses an engine ignition capacitor aging test fault detection device, and aims to provide an automatic detection device which is accurate in fault judgment and capable of eliminating interference. The engine ignition capacitor aging test fault detection device is implemented according to the following technical scheme: a main ignition device circuit is connected to tested ignition capacitors through a sampling circuit, the sampling circuit is electrically connected to a signal and data processing control module through a channel isolation and processing control circuit, the main ignition device circuit, a parameter setting circuit, an operating mode setting circuit, a self-checking circuit, a buzzer, a power supply module and an indicating circuit are electrically connected by taking the signal and data processing control module as a core, the sampling circuit sends isolation signals to the signal and data processing control circuit through the channel isolation and processing control circuit so as to perform peak detection on each path of current, current peak data comparison is set correspondingly, fault judgment is performed after current peak data comparison, the signal and data processing control circuit cuts off a detection power supply when a sampled peak of any path exceeds a correspondingly set peak error range, and an alarm sound is given out through the buzzer.

Description

technical field [0001] The invention relates to an engine ignition capacitor aging test failure detection device, in particular for automatic detection of aerospace engine ignition capacitor aging tests. Background technique [0002] Burn-in test is a method commonly used in engineering to eliminate early failure products and improve system reliability. The burn-in test is one of the screening tests for high-reliability integrated circuits, and its purpose is to screen or eliminate those barely qualified circuits. These circuits are either due to inherent defects in the raw materials used or defects introduced by improper control of the manufacturing industry, and these defects will induce circuit-related failures over time and stress. In order to screen out circuits with these defects before submitting the circuits to users. When screening, it is necessary to apply stress to the circuit at or above the maximum rated working condition, or to apply equivalent or higher sens...

AI Technical Summary

Problems solved by technology

Due to the high voltage of the engine ignition device capacitor during charging and discharging, the strong impact interference caused by strong current and reverse negative high voltage, the logarithmic and analog sampling circuits will have great interference, resulting in unstable and inaccurate sampling. can't even work

And in order to locate the fault in time, it is necessary to simultaneously sample the ignition capacitor circuits of each circuit, which is even more difficult

Images