A high-precision measurement device and method for wide-band large dynamic signals

Abstract

The present invention proposes a wide-band large dynamic signal high-precision measurement device and method, which solves the current commonly used frequency domain analysis method, which does not have a setting method for adaptively configuring demodulation channel state parameters according to the signal to be measured, and lacks flexibility. , the test accuracy is not high, and it does not meet the requirements of metrological testing. The high-precision measurement device and method for wide-band large dynamic signals of the present invention utilize the pre-tested signal characteristic parameters of the test device to optimize the configuration of the channel gain value and demodulation bandwidth value of the test device by creating an automatic rule processor to achieve wide-band High-precision measurement of large dynamic signals.

Description

technical field [0001] The invention relates to the communication field, in particular to a high-precision measurement device for wide-band large dynamic signals, and also relates to a high-precision measurement method for wide-band large dynamic signals. Background technique [0002] With the rapid development of military communications and civilian communications, broadband signal generation technology has also developed rapidly, which is characterized by wider and wider signal frequency bands and more and more complex modulation systems. Typical characteristic parameters include signal frequency parameters and amplitude parameters. and modulation parameters, etc. [0003] At present, the test of signal frequency and amplitude parameters mostly adopts frequency domain analysis test method, but the test process of modulation parameters is more complicated, and it is necessary to optimize the settings of frequency domain analysis test state parameters such as center frequenc...

AI Technical Summary

Problems solved by technology

When the input signal power of the measurement device is 0dBm, and the demodulation bandwidth is 1MHz, the abnormal response due to the harmonic distortion of the ADC usually exceeds -70dBc. According to the theoretical formula of the influence of random noise on the measurement results, the precise modulation parameters can be realized. Extraction requires a signal-to-noise ratio of at least 37dB. At this time, the signal-to-noise ratio of the signal to be tested and the false response is only 14dB. The superposition of abnormal response signals and random noise seriously deteriorates the measurement accuracy of the modulated signal.

[0006] The frequency domain analysis method commonly used at present does not have a setting method for adaptively configuring the demodulation path state parameters according to the signal to be tested, lacks flexibility, and the test accuracy is not high, which does not meet the measurement test requirements

In the process of use, testers need to manually adjust channel parameters according to the characteristics of the signal to be tested, such as modulation rate, sideband amplitude, etc., based on test experience. Different channel setting parameters will get different test results. Therefore, this type of test method has the advantages of Larger limitations

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