8results about "Modulation depth measurements" patented technology

Disclosed is a test device to test the operation of an MMC by fabricating only one or several SMs constituting the MMC testing under real-time operating conditions. The test device for a modular multi-level converter (MMC) includes a simulation model of an MMC having at least one arm to which sub modules (SMs) are serially connected, at least one test target SM among the serially connected SMs being replaced with a dependent voltage source; an arm current simulation circuit including an equivalent SM that implements the test target SM as actual physical hardware and an inverter that supplies current to the equivalent SM; and a control unit configured to control the arm current simulation circuit to correspond to an operation of the simulation model and set a voltage corresponding to a charge / discharge voltage of the equivalent SM of the arm current simulation circuit to the dependent voltage source.

The present invention relates to a method for probing a circuit breaker electrically connected to an electric line. The probing method comprises the following steps: - injecting (101) a first signal (S1(t)) at a first point (A) of said electric line, wherein said first signal has a predefined frequency content and a predefined frequency band and is injected during an injection time interval (TJ) having a predefined time duration; - detecting (102) a second signal (S2(t)) at a second point (B) of said electric line, wherein said second signal is detected during a detection time interval (TD) including at least partially said injection time interval (TJ); - processing (103) a first portion of said second signal (S2(t)), which refers to a first portion (TJ) of said detection time interval (TD), during which said first signal (S1(t)) is injected, to calculate a first signal value (GJR) indicative of the signal power of said second signal (S2(t)) in the frequency band of said first signal S1(t), during the first portion (TJ) of said detection time interval (TD); - processing (104) a second portion of said second signal (S2(t)), which refers to a second portion (TN) of said detection time interval (TD), during which said first signal (S1(t)) is not injected, to calculate a second signal value (GN) indicative of the signal power of said second signal (S2(t)) in the frequency band of said first signal S1(t), during the second portion (TN) of said detection time interval (TD).

A quantum modulation classifier. The quantum modulation classifier includes a trained quantum variational classifier including a plurality of qubits. The quantum variational classifier includes an embedding stage operable to apply a quantum embedding technique to embed a modulated radio signal, a variational stage operable to receive the modulated radio signal from the embedding stage and pass the modulated radio signal through a plurality of variational layers, and a measurement stage operable to receive the modulated radio signal from the variational stage and extract measurement results to classify the modulated radio signal.

A system for electromagnetic tomography within air-filled imaging chamber, thereby reconstructing 3D and / or 2D images ε(r)dupdated of dielectric properties of an object under the study, includes an electromagnetic measurements system, an imaging chamber having an air-filled central cavity, computational means, an analog-to-digital converter (ADC) for digitizing acquired EM signals from the electromagnetic measurements system, and a processor system that executes imagining and processing algorithms. The imaging chamber includes a dielectric layer surrounding the air-filled central cavity, a ceramic antenna layer surrounding the dielectric layer, and an absorptive layer surrounding the ceramic antenna layer, wherein the ceramic antenna layer includes an array of antennas that form part of the electromagnetic measurement system.

An example apparatus is configured to electrically connect to a device under test (DUT). The apparatus includes a first interface circuit to communicate with a test instrument using a first protocol and a second interface circuit to receive signals containing data from the DUT having a second protocol. The second interface circuit is configured to oversample the signals containing data in voltage and time to produce sampled data. Oversampling includes sampling the signals containing data at a rate that is higher than the Nyquist rate. Circuitry is configured to receive the sampled data from the second interface circuit, to generate the data having the first protocol based on the sampled data, and to output the data having the first protocol to the test instrument via the first interface circuit.

A method for probing a circuit breaker electrically connected to an electric line is described. The probing method comprises injecting a first signal at a first point of said electric line. The probing method further comprises detecting a second signal at a second point of said electric line. The probing method further comprises processing a first portion of said second signal, to calculate a first signal value indicative of the signal power of said second signal in the frequency band of said first signal, during the first portion of said detection time interval. The probing method further comprises processing a second portion of said second signal, to calculate a second signal value indicative of the signal power of said second signal in the frequency band of said first signal, during the second portion of said detection time interval.

The present invention relates to a micro-current photon sensing detection device and method using a 5mA-type micro-current photon sensing NV quantum sensor, the device comprising: a power supply unit (100); a quantum dot qubit control signal generation module (200); a multi-channel pulse waveform generation control module (300); a bias magnetic field formation control module (400); a green laser generation control module (500); a microwave signal generation module (600); a micro-current sensing NV quantum sensor module (700); an optical fiber unit (800); a photodiode unit (900); and a micro-current photon analysis control module (900a), thereby supporting a wide frequency range to 10 GHz in DC through the quantum dot qubit control signal generation module.

Disclosed is an apparatus for detecting a current of a power factor correction circuit, the apparatus detecting a current through a current sensor provided to allow a current corresponding to a current flowing in an inductor of a boost type power factor correction circuit to flow. The apparatus for detecting a current of a power factor correction circuit comprises a slope calculation unit for calculating a first slope corresponding to a slope of a current of the inductor in a period during which a switching element of the boost type power factor correction circuit is turned on, and a second slope corresponding to a slope of a current of the inductor in a period during which the switching element is turned off, determines a detection time point of the current of the inductor in the period during which the switching element is turned off if the magnitude of the first slope is greater than the magnitude of the second slope, and determines a detection time point of the current of the inductor in the period during which the switching element is turned on if the magnitude of the first slope is less than or equal to the magnitude of the second slope.