An Observability Method for Check Bits in External Memory

An external memory and parity bit technology, applied in the computer field, can solve the problems of high cost, inability to realize parity bit observability, inability to realize parity bit observation in real time, etc. The effect of work efficiency

Active Publication Date: 2019-07-23
BEIJING MXTRONICS CORP +1
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, there are many problems in the existing debugging mode scheme: the debugging unit module can only realize the observability of the check digit when the space computer is in the non-working state, and cannot realize the check digit observability when the space computer is in the working state. Observability, there are certain limitations, and it is impossible to realize the observation of check digits in real time
Secondly, additional third-party equipment needs to be added, which costs more

Method used

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  • An Observability Method for Check Bits in External Memory
  • An Observability Method for Check Bits in External Memory
  • An Observability Method for Check Bits in External Memory

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Embodiment Construction

[0033] In order to make the purpose, technical solution and advantages of the present invention clearer, the following will further describe the public implementation manners of the present invention in detail with reference to the accompanying drawings.

[0034] refer to figure 1 , shows a flow chart of steps of a method for observability of parity bits of an external memory in an embodiment of the present invention. In this embodiment, the observability method of the parity bit of the external memory includes:

[0035] Step 101, acquire the first check digit corresponding to the storage object to be observed from the external memory.

[0036] In this embodiment, when the external memory controller reads the storage object to be observed from the external memory, it may acquire the first parity bit corresponding to the storage object to be observed. Wherein, preferably, the storage object to be observed includes: a data object and / or a program object.

[0037] It should be...

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Abstract

The invention discloses an observability method for external memory check bits. The observability method for the external memory check bits includes the steps that a first check bit corresponding to a to-be-observed object is obtained from an external memory; the to-be-observed object is located in an effective area of the external memory; the first check bit is saved in local; the observation procedure is called, the first check bit saved in local is read, and the first check bit serves as an observation check bit to be output; the observation check is located inside the external memory and outside of an effective observation area. By means of the observability method for the external memory check bits, covering of the check bits carried by the observation procedure to the first check bit corresponding to the to-be-observed object is avoided, real-time observation of the check bits is achieved, and the cost is reduced.

Description

technical field [0001] The invention belongs to the technical field of computers, and in particular relates to an observability method of a parity bit of an external memory. Background technique [0002] The space computer is affected by radiation, which may lead to wrong logic state of the semiconductor circuit, which will cause the storage content in the storage body to change suddenly between "0" and "1", which will affect the function of the semiconductor device. Event Upset, SEU). In order to resist single event flipping, in the external memory accessed by the space computer processor, the stored data must be matched with the corresponding check bit, so as to meet the observation requirements of the check bit of the external memory during the application process of the space computer processor . [0003] At present, the observation of the parity bit is usually realized by using the debugging mode: the access to the external memory and the observation of the parity bit...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22G11C11/413
CPCG06F11/2273G11C11/413
Inventor 苏天红文治平陈雷彭和平于立新庄伟
Owner BEIJING MXTRONICS CORP
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