sir insulation resistance test system

Abstract

The invention provides an SIR testing system, comprising a control box; a programmable high voltage power supply in connection with the control box to provide power supply to the control box; an industrial personal computer in connection with the programmable high voltage power supply to control the programmable high voltage power supply; a programmable switch in connection with the control box to realize the switching among a plurality of testing channels; a switchboard connected with the control box, the industrial personal computer and the programmable switch respectively to provide a signal channel; an externally provided box in connection with the programmable switch; an environmental test chamber in connection with the industrial personal computer and an ammeter in connection with the control box to measure. Compared with the prior art, the testing system of the invention has the following advantages: 1) simplifying repetitive testing procedures; 2) avoiding errors of manual measurement; and 3) conducting more advanced data analysis.

Description

technical field [0001] The invention relates to the technical field of semiconductor printed circuit boards, in particular to an SIR insulation resistance testing system for evaluating ion migration characteristics of various insulating materials. Background technique [0002] With the rapid development of semiconductor materials and printed circuit boards, test and measurement equipment for evaluating the surface insulation resistance of the measured object was invented. Potential problems with assemblies. These failures can be caused by material interactions, inadequate process control, or poor material properties. Sheet resistance, conductivity, and leakage of electrolytic contaminants are all factors that affect insulation resistance. Based on the method of insulation resistance testing, different measured objects are different, and there are safety problems in the process of using electricity. In electrical equipment, such as motors, cables, household appliances, etc....

AI Technical Summary

Problems solved by technology

[0005] Disadvantages: the accuracy is too low, the relationship between voltage and resistance cannot be correctly reflected, let alone long-term large-scale measurement and scientific analysis

[0009] Disadvantages: There is a certain basis for operators and users. Each time, manual measurement and manual recording of test data are required. The labor intensity is high, and there is a risk of being shocked by high voltage during the test process.

Each measurement time and measurement interval will be interfered by human factors, and 24-hour uninterrupted measurement cannot be carried out. The statistics of test data are all carried out manually

Many of the above factors have led to a decrease in the accuracy of the measurement, which is not conducive to the analysis of the experimental results.

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