Test system and test method for testing semiconductor laser

Abstract

The present invention discloses a working performance detecting technology for a semiconductor laser, and particularly relates to a test system and a test method for testing the semiconductor laser, which belong to the technical field of semiconductor photoelectric device manufacturing technology. The system comprises a to-be-tested optical device and a high and low temperature circulation box used for placing the to-be-tested optical device. The to-be-tested optical device is connected with a current source used for supplying a current source to the to-be-tested optical device. The to-be-tested optical device is also connected with an optical power meter used for testing the output optical power. The current source and the output signal end of the optical power meter are connected with a computer. Based on the above structure and the above method, the detection can be conveniently, effectively and quickly conducted. The working stability and the failure mode of a laser are pre-determined, so that the detection period is greatly shortened. The detection cost is greatly reduced. Meanwhile, the production process is effectively controlled and the product cost is reduced to a minimum value. Simultaneously, the benefits of customers are ensured. The test method is simple and convenient. The construction cost of the test system is low.

Description

technical field [0001] The invention relates to a working performance detection technology of a semiconductor laser, in particular to a testing system and a testing method of a semiconductor laser, belonging to the technical field of semiconductor photoelectric device manufacturing. Background technique [0002] With the rapid development of semiconductor optoelectronic device manufacturing technology, the reliability requirements of optical devices are getting higher and higher, so it is very necessary to test the reliability of devices in the production process. Among them, in the prior art, the testing method of the optical power stability of the device working in the high and low temperature environment has always been based on the high-end chip screening method and the sample delivery test of the client terminal. Traditionally, such testing will cause many errors. The determined influencing factors make the production process unable to be effectively controlled, and the...

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Problems solved by technology

Among them, in the prior art, the testing method of the optical power stability of the device working in the high and low temperature environment has always been based on the high-end chip screening method and the sample delivery test of the client terminal. Traditionally, such testing will cause many errors. The determined influencing factors make the production process unable to be effectively controlled, and there are also problems such as long inspection cycle and high cost

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