Arc-shaped glass panel defect detecting method used for curved surface electronic display screen

A curved glass, defect detection technology, applied in measuring devices, optical devices, instruments, etc., can solve problems such as inability to detect high-precision glass panels

Active Publication Date: 2017-05-24
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

[0004] Aiming at the deficiencies of the above-mentioned traditional detection methods, the present invention discloses a method for detecting defects of curved glass panels for curved electronic display screens. The structured light lighting technology is used in the field of defect detection of glass panels for electronic display screens, which overcomes the inability of traditi

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  • Arc-shaped glass panel defect detecting method used for curved surface electronic display screen
  • Arc-shaped glass panel defect detecting method used for curved surface electronic display screen
  • Arc-shaped glass panel defect detecting method used for curved surface electronic display screen

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Embodiment Construction

[0035] Structured light lighting technology is based on the principle of phase and gradient detection. The phase and gradient changes of the defect relative to the surrounding position are more obvious than the light intensity changes. For defects of various sizes and depths on the glass surface, it can be accurately detected according to the phase and gradient changes. It has the advantages of non-contact, high sensitivity, high precision and high efficiency.

[0036] The invention discloses a method for detecting defects of curved glass panels for curved electronic display screens. The method applies structured light lighting technology to the field of defect detection for glass panels of electronic display screens, and overcomes the inability of traditional measurement methods to measure glass panels with curved edges with high precision. The disadvantage of arc edge defects with large curvature is that for glass panels with arc edges, double-measurement arc edges and middle...

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Abstract

The invention provides an arc-shaped glass panel defect detecting method used for a curved surface electronic display screen, and belongs to the optical three-dimensional measurement technology field. A structured light illumination technology is used for an electronic display screen glass panel defect detecting field, and a defect of a conventional detecting method of inability of carrying out the high precision detection of the arc-shaped edge of the glass panel provided with the arc-shaped edge having large curvature is overcome, and then the glass panel provided with the arc-shaped edge is used for the high precision detection of the defects of the arc-shaped edges of the double sides and the middle planar part of the glass panel. The arc-shaped glass panel defect detecting method has an advantage of rapid, high-precision, non-contact, and high-sensitivity detection.

Description

technical field [0001] The invention relates to the technical field of optical three-dimensional measurement, in particular to a defect detection method of a curved glass panel for a curved electronic display screen. Background technique [0002] With the rapid development of the mobile Internet industry and the rapid expansion of the market for electronic products such as mobile phones and tablet computers, the glass panels used to protect the display screens of electronic products are becoming more and more diverse. In order to meet user comfort requirements, more and more electronic products are equipped with glass panels with curved edges. In recent years, with the emergence of curved display screens and their successful application on some mobile phones, the market for glass panels with curved edges used to protect curved screens has also developed rapidly. The demand for various types of electronic display glass panels is increasing day by day, and the quality control...

Claims

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Application Information

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IPC IPC(8): G01B11/30
CPCG01B11/30
Inventor 岳慧敏潘志鹏陈红丽李绒吴雨祥刘永
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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