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Dual-axis inclinometer and calibration method

A dual-axis inclination and calibration method technology, which is applied in the direction of instruments, measuring inclination, and measuring devices, can solve problems such as increased measurement errors of inclinometers, affecting cross-coupling of inclinometers, and installation of detection axes that are not completely orthogonal. The effect of improving accuracy

Inactive Publication Date: 2017-05-31
JIAXING NAJIE MICROELECTRONICS TECH
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Problems solved by technology

When the measured inclination value approaches 90°, it is almost impossible to measure
[0005] In practical engineering applications, due to the installation error of the accelerometer, each detection axis is not completely perpendicular to the installation. When one of the axes changes, the other axes will also change greatly, which will eventually affect the cross-coupling of the inclinometer. At present The cross-coupling of inclinometers on the market is more than 2%
Due to the inherent characteristics of Micro-Electro-Mechanical System (MEMS) sensors, the nonlinearity of the sensor will greatly affect the accuracy of the angle measurement of the inclinometer. In existing products, the output of the sensor is generally linear by default, so that It will increase the measurement error of the inclinometer

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Embodiment 1

[0034] The invention provides the invention provides a biaxial inclinometer, the biaxial inclinometer, including: a base, an inclination sensor installed on the base, and a signal processing device for obtaining measured values ​​from the inclination sensor, at the output of the signal processing device The terminal is connected to the RS232 output terminal;

[0035] Wherein, the inclination sensor includes a biaxial sensor installed horizontally on the base, and an acceleration sensor installed vertically on the base;

[0036] Establish a three-dimensional coordinate system in the space where the dual-axis inclinometer is located, where the X and Y axes represent two coordinate axes perpendicular to each other in the horizontal plane, and the Z axis represents the coordinate axis perpendicular to the horizontal plane.

[0037] Optionally, the dual-axis sensor is a SCA100T chip used to measure the acceleration of the X-axis and the Y-axis.

[0038] Optionally, the acceleratio...

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Abstract

The embodiment of the invention provides a dual-axis inclinometer and a calibration method. The dual-axis inclinometer comprises a pedestal, a tilt angle sensor arranged on the pedestal and signal processing equipment for acquiring a measuring value from the tilt angle sensor, wherein the output end of the signal processing equipment is connected with an RS232 output end; the tilt angle sensor comprises a double-axis sensor horizontally arranged on the pedestal and an acceleration sensor vertically arranged on the pedestal; and the sensor for measuring the accelerated speed in the vertical direction is provided to supplement for the original double-axis sensor for measuring two mutually vertical directions, so that the measuring accuracy of the inclinometer is improved.

Description

technical field [0001] The invention belongs to the field of measuring equipment, in particular to a biaxial inclinometer and a calibration method. Background technique [0002] High-precision inclinometers are widely used in various fields such as vehicle chassis leveling detection, high tower or high-rise monitoring, bridge and dam monitoring, and high-precision laser platform equipment. In this case, the accuracy is not high, which cannot meet the needs of practical applications. [0003] Among the schemes adopted by dual-axis inclinometers on the market, the more mainstream one is to use one dual-axis accelerometer to measure the inclination values ​​in two mutually perpendicular directions. [0004] When the accelerometer is arranged horizontally, two mutually perpendicular scene values ​​can be measured using a dual-axis accelerometer. However, from the analysis of the measurement principle of the accelerometer and its calculation method, it can be seen that when the...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01C9/00G01C25/00
CPCG01C9/00G01C25/00
Inventor 董杰薛晓东李森林沈烨斌
Owner JIAXING NAJIE MICROELECTRONICS TECH