Liquid crystal display test board and television testing device

Abstract

The invention discloses a liquid crystal display test board and a television testing device. The liquid crystal display test board comprises a power input end, a voltage conversion circuit, a pin circuit, a backlight control circuit, a control signal output end and an aging test connector. The voltage conversion circuit converts voltage of the power input end into test trigger voltage and supply voltage of a TFT liquid crystal display to be tested. The pin circuit outputs test trigger voltage to the aging test connector. The backlight control circuit is used for outputting a brightness control signal controlling the brightness of the TFT liquid crystal display to be tested to the control signal output end, so as to control the TFT liquid crystal display to be tested to be always in a brightest state during aging testing. The aging test connector is connected with an aging test interface of the TFT liquid crystal display to be tested, and outputs supply voltage and test trigger voltage to corresponding pins of the aging test interface of the TFT liquid crystal display to be tested. In this way, the aging test cost of the TFT liquid crystal display is reduced, and the aging test process of the TFT liquid crystal display is simplified.

Description

technical field [0001] The invention relates to the field of televisions, in particular to a liquid crystal screen test board and a test device for the television. Background technique [0002] In the module production process of TV sets, it is necessary to carry out aging tests on the TFT LCD screens of TV sets, so as to discover the display defects of the TFT LCD screens in advance and test the reliability of the TFT LCD screens. In the prior art, the aging test method for the TFT liquid crystal screen of the TV is to light the TFT liquid crystal screen through the movement board of the television to carry out the aging test to it. / R / G / B Aging screen. The aging test method of the TFT liquid crystal screen in the prior art has high test cost, occupies resources of the core board, and affects other functions of the core board. Moreover, the aging test trigger methods and aging test interfaces of TFT LCD screens produced by different manufacturers (such as Huaxing Optoelec...

AI Technical Summary

Problems solved by technology

The aging test method of the TFT liquid crystal screen in the prior art has high test cost, occupies the resources of the core board, and affects other functions of the core board

Moreover, the aging test trigger methods and aging test interfaces of TFT LCD screens produced by different manufacturers (such as Huaxing Optoelectronics, Samsung, LG, Innolux, and AUO) are different. Therefore, when it is necessary to test the TFT LCD screens produced by different manufacturers When performing burn-in tests on screens, many types of wires are required to match the corresponding burn-in test interfaces. There are many types of wires and it is difficult to manage, and the test process is also complicated.

Images