NVRAM-based memory allocation linked list and memory allocation method

A technology of memory allocation and linked list, applied in the field of memory management, can solve problems such as wear leveling, achieve the effect of reducing usage loss and improving service life

Active Publication Date: 2017-06-13
HUAZHONG UNIV OF SCI & TECH
View PDF4 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This solves the wear leveling problem of the existing non-volatile memory NVRAM during memory allocation, in order to improve the service life of NVRAM memory

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • NVRAM-based memory allocation linked list and memory allocation method
  • NVRAM-based memory allocation linked list and memory allocation method
  • NVRAM-based memory allocation linked list and memory allocation method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0042] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0043] Such as figure 2 Shown is a schematic diagram of an embodiment of the memory allocation chain of the present invention, including:

[0044] Fastbins, an array, is used to record all fast bin linked lists, and the linked list uses the FIFO method to insert or delete chunks in the linked list;

[0045] Bins, an array, is used to record all new bin, small bin and large bin linked lists. T...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses an NVRAM-based memory allocation linked list, and belongs to the field of memory management. On the basis of a traditional existing memory allocation technology, the novel memory allocation linked list is provided. The linked list comprises a delayed allocation linked list, Fastbins and Bins. A fast bin linked list in the Fastbins adopts an FIFO (first in, first out) method for perofrming chunk insertion or deletion in the linked list, and the local bin read-write operations are reduced; the Bins adds an allocation counter for each small bin and new bin linked list, the allocation frequency of each bin is monitored, the new bin is allocated to the bin exceeding an allocation threshold so as to reduce abrasion of a high read-write region; the delayed allocation linked list provides delayed time for a reallocated memory region. The invention further provides an NVRAM-based memory allocation method. By adopting the technical scheme, the NVRAM memory consumption loss can be effectively lowered, and the NVRAM memory service life can be prolonged.

Description

technical field [0001] The invention belongs to the field of memory management, and more specifically relates to an NVRAM-based memory allocation linked list and a memory allocation method. Background technique [0002] According to the change of Gartner technology maturity curve from 2014 to 2015, big data has gone through the expansion period and the peak period, and disappeared on the curve in 2015, which shows that the basic concepts, key technologies and utilization of big data have been recognized. Widely recognized by the industry, it has become a consensus in the industry to process and analyze big data to discover the economic value contained in it. Big data also poses new challenges for storage. New applications such as in-memory computing for big data require 1,000 times the current memory capacity. At the same time, the development of traditional DRAM (Dynamic Random Access Memory) has encountered a bottleneck: the existing DRAM size process has reached the limi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F12/02
CPCG06F12/0238
Inventor 童薇冯丹刘景宁刘翔蒋瑜
Owner HUAZHONG UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap