Aging clamp, and methods for performing contact condition and aging result test with same clamp

Abstract

The invention provides an aging clamp which has a reasonable structure and multiple stations, achieves batch operation, is convenient to perform contact condition test, and comprises an upper clamp and a lower clamp. The lower clamp comprises a clamp lower plate. The clamp lower plate is at least provided with aging plates. Each aging plate is provided with aging stations. Each aging station comprises an element groove. A contact comprises a lower contact arranged on the bottom of the element groove. The upper clamp comprises a clamp upper plate. The upper contact and the lower contact cooperatively clamp a capacitor. The lower clamp also comprises a lower PCB board arranged at the lower end of the clamp lower plate. The lower PCB board is provided with a detection circuit corresponding to each aging station. Each detection circuit comprises a protection resistor, a first test point and a second test point, and the second test points are connected in parallel. The capacitor forms a loop with the first test point, the second test point and the protector resistor through the contacts. The invention also provides a method for performing contact condition test with the clamp and a method for performing aging result test with the clamp.

Description

technical field [0001] The invention relates to the technical field of capacitor manufacturing, in particular to an aging jig and a method for testing contact conditions and aging results using the jig. Background technique [0002] In the production process of capacitors, capacitors need to be subjected to high-temperature aging under voltage for a certain period of time, and defective products are eliminated in the form of early failure, so as to ensure that the selected products can work reliably within the life cycle. Considering factors such as the large output of capacitors, control costs, and long aging time, it is currently impossible to independently apply voltage aging for a single capacitor. Generally, batch capacitors are connected in parallel and simultaneously applied voltage and high-temperature aging. Usually shrapnel or probes are used. There are the following problems in the existing fixture form: [0003] In the existing fixture form, because the contact...

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Problems solved by technology

[0003] In the existing fixture form, because the contacts of the fixture are in a high-temperature working state for a long time, due to surface wear, oxidation or insufficient elasticity, it may cause poor contact between the contacts of the fixture and the electrodes of the capacitor lead-out end, so that the capacitor is not in a good position during aging. In the power-on state, it causes invalid aging. Now the aging station in the aging fixture is an independent circuit. If contact is required, each station needs to be led out from two wires. There are several stations that have several transfer points. , the existing aging fixture can only realize the contact condition detection operation when a small number of stations are set. In practical applications, after the aging fixture has a large number of stations, such as 1000 stations, 1000 core joints are required , the existing fixture is difficult to achieve such a setting, and it is impossible to realize batch operation. Such a fixture also has a large plugging resistance and is inconvenient to operate.

Moreover, the existing jig form cannot directly screen out the defective products after aging, and all products need to be taken out before the screening process can be carried out, and it is impossible to directly carry out the screening work in the aging jig

[0004] At the same time, the existing fixture form is inconvenient for loading and unloading. This problem is mainly manifested in the fixture of the shrapnel mode. When placing and taking out the capacitor, the two ends of the capacitor are clamped by the shrapnel. It is necessary to use a tool to apply a certain force. Discharge container, and this method is suitable for manual operation, not conducive to the use of automation

[0005] At the same time, the existing fixture forms have poor contact reliability. This problem is mainly manifested in the pattern fixture of the hard probe. The hard probe is welded on two fixture plates, and the capacitor is placed in one fixture plate and covered with another fixture. plate, so that the hard probes of the two fixture plates contact the two electrodes of the container, but because a single probe is a hard probe without independent elasticity, and the number of capacitors is large, the size of the capacitor is small or the hard probe is short. There will be a problem that the contact point of the probe cannot be probed, so that the capacitor cannot be aged with voltage; in addition, the cost of the existing fixture is high, and the fixture is laborious to install. This problem is mainly manifested in the fixture of the elastic probe mode , the elastic probes are welded on the two fixture plates, the capacitor is put into one fixture plate, and then covered with another fixture plate, so that the probes of the two fixture plates touch the two electrodes of the container, due to the two electrodes on the two fixture plates The probes are all elastic probes, which leads to high cost, and when a large number of capacitors are aging, the number of probes is large, resulting in a large reverse force of the probe spring when the overall fixture is clamped, resulting in laborious clamping

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