soc chip power supply noise monitoring system

Abstract

The invention relates to a SoC on-chip power supply noise monitoring system, including a step-down device, a differential sample hold circuit, and a signal processing device. The input positive electrode and the input negative electrode of the differential sample and hold circuit are connected to the step-down device, the output positive electrode and the output negative electrode of the differential sample and hold circuit are connected to the signal processing device. The step-down device depressurizes and converts an incoming SoC on-chip power supply signal to obtain a differential signal and inputs it to the differential sample and hold circuit. The differential sample and hold circuit converts the differential signal into a discrete voltage signal and outputs it to the signal processing device, and the signal processing device analyzes the discrete voltage signal to obtain power supply voltage data. By directly sampling and analyzing the power supply voltage signal, there is no need to indirectly measure the delay of the circuit to reflect the change in the power supply voltage. Real-time monitoring and analysis of SoC on-chip power supply voltage size and change can be achieved, and the monitoring accuracy is high.

Description

technical field [0001] The invention relates to the technical field of microelectronics, in particular to a SoC on-chip power supply noise monitoring system. Background technique [0002] With the development of microelectronics technology, the integration, complexity and working speed of integrated circuits, especially System on Chip (SoC), have been greatly improved, and their reliability has attracted widespread attention. When the SoC is working, it will be affected by various parasitic phenomena such as switching noise, electromagnetic interference, voltage source variation, crosstalk, ground bounce and substrate coupling noise, or when the SoC is working in a very harsh environment, it will be affected by lightning , radiation, and severe temperature changes. These factors will cause obvious changes and fluctuations in some key voltage signals inside the SoC. fail. In order to avoid or alleviate the above problems, it is necessary to accurately measure the SoC noise ...

AI Technical Summary

Problems solved by technology

This method can only monitor whether the power supply voltage exceeds a certain range, but cannot accurately measure the power supply voltage, and has the disadvantage of low monitoring accuracy

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