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A photogrammetry method for camera scanning imaging

A photogrammetry and scanning imaging technology, applied in measurement devices, instruments, optical devices, etc., can solve the problems of small field of view, low measurement rate, inability to achieve multi-point measurement, etc., to achieve large field of view and measurement range. Large, fast measurement results

Active Publication Date: 2019-03-29
AVIC BEIJING CHANGCHENG AVIATION MEASUREMENT & CONTROL TECH INST +2
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The object of the present invention is to provide a photogrammetry method for scanning and imaging with a camera to solve the problems of small field of view, low measurement rate, and inability to realize multi-point measurement in the existing measurement method. The technical solution is as follows:

Method used

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  • A photogrammetry method for camera scanning imaging
  • A photogrammetry method for camera scanning imaging
  • A photogrammetry method for camera scanning imaging

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Embodiment

[0055] In this specific embodiment, an outdoor environment with sufficient light is selected to perform three-dimensional coordinate measurement on a target on a large workpiece.

[0056] The measurement platform is set up. The No. 1 measurement platform plane mirror is placed on the single-axis turntable. The reflection surface 204 of the plane mirror passes through the rotation axis 206 of the single-axis turntable, and the rotation axis 206 of the single-axis turntable is parallel to the imaging surface 202 of the line-scan camera. And perpendicular to the optical axis 203 of the line array camera, the rotation axis 206 of the single-axis turntable is perpendicular to the horizontal plane, the construction of the second measurement platform is the same as that of the No. for θ 垂直 =90°. The rotation axes of the single-axis turntables of No. 1 and No. 2 measuring platforms are strictly perpendicular to the horizontal plane, otherwise obvious orientation errors will be introd...

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Abstract

The invention belongs to a space three-dimensional measurement technology, and relates to a photogrammetry method for camera scanning imaging. A measurement platform used in the photogrammetry method comprises a linear array camera, a measurement host, an image processing module, a single-axis turntable, and a plane mirror. The measurement steps are as follows: measurement platforms are built; the location relationship parameters between the modules inside the measurement platforms and the location relationship parameters between the two measurement platforms are calibrated and acquired; single-axis turntables drive plane mirrors to move and trigger linear array cameras to carry out synchronous acquisition; measurement hosts stitch single-frame images to get a whole image; and the measurement hosts acquire the horizontal angle and vertical angle information of the center point of a target through image processing modules and the single-axis turntables, and complete calculation of the three-dimensional coordinates of a spatial point.

Description

technical field [0001] The invention belongs to space three-dimensional measurement technology, and relates to a photogrammetry method for scanning and imaging with a camera. Background technique [0002] In the context of the rapid advancement of national important projects such as large aircraft, manned spaceflight and large radar, the importance and urgency of space three-dimensional measurement technology have become increasingly prominent, and higher requirements have been put forward for target position measurement. The measurement system should have a large coverage to adapt to different application scenarios, while ensuring sufficient high measurement accuracy and measurement efficiency. In the process of large-scale equipment manufacturing and assembly, due to factors such as the overall large geometric size of the workpiece, difficulty in moving, measurement environment and measurement efficiency, large-scale measurement is obviously different from conventional dim...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00
CPCG01B11/005
Inventor 姜军来张华甘志超杨超阎炎马燕飞
Owner AVIC BEIJING CHANGCHENG AVIATION MEASUREMENT & CONTROL TECH INST
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