Semi-analytic calculation method for eddy nondestructive testing magnetic field containing column defect

A non-destructive testing and calculation method technology, applied in the design field of semi-analytical calculation method, can solve problems such as low calculation efficiency, inability to know the explicit connection of electromagnetic field signals of model materials, calculation error of solution results, etc., and achieve the effect of improving solution efficiency.

Active Publication Date: 2017-08-11
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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Problems solved by technology

[0007] (1) The numerical solution obtained by finite element simulation cannot know the explicit relationship between model material, defect size and electromagnetic field signal;
[0008] (2) When the model is divided into meshes during the finite element simulation process, the model is discretized,

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  • Semi-analytic calculation method for eddy nondestructive testing magnetic field containing column defect
  • Semi-analytic calculation method for eddy nondestructive testing magnetic field containing column defect
  • Semi-analytic calculation method for eddy nondestructive testing magnetic field containing column defect

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Embodiment Construction

[0025] Embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0026] The invention provides a semi-analytical calculation method for the magnetic field of eddy current nondestructive testing containing columnar defects, such as figure 1 shown, including the following steps:

[0027] S1. According to the distribution of materials and defects, the defect detection model is divided into solution areas.

[0028] For the electromagnetic field problem, all physical quantities of the electromagnetic field can be deduced theoretically after obtaining the magnetic vector potential, so the electromagnetic field calculation problem often takes the magnetic vector potential as the initial solution object. Embodiments of the present invention aim at figure 2 The defect detection model in (a) calculates its detection physical quantity, and first takes the magnetic vector potential as the solution target quantity. To solve th...

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Abstract

The invention discloses a semi-analytic calculation method for an eddy nondestructive testing magnetic field containing a column defect. According to the method, mathematical physics and electromagnetic field principles are utilized to obtain a precise analytic expression of magnetic vector potential under a Laplace domain, and numerical method inverse Laplace transformation is performed on a complex expression of a series form of the magnetic vector potential based on MATLAB to obtain a time-domain solution to an eddy nondestructive testing signal in a conductor containing the column defect. Through the method, the eddy nondestructive testing magnetic field of the conductor containing the column defect can be calculated accurately and efficiently, and a theoretical basis is provided for application of the eddy nondestructive testing technology in the defect quantitative recognition field.

Description

technical field [0001] The invention belongs to the technical field of defect detection of metal test pieces, and in particular relates to the design of a semi-analytic calculation method for an eddy current nondestructive detection magnetic field containing columnar defects. Background technique [0002] In the field of defect detection of metal specimens, the eddy current nondestructive testing method has many advantages compared with other testing methods, such as high detection accuracy, low cost, no need for couplant, safe and green to the human body and the environment. Exploring the relationship between the electromagnetic field signal, the excitation source signal and the defect information, that is, the research on the forward problem of eddy current nondestructive testing is the basis of eddy current defect identification, and has theoretical guiding significance for the development of testing instruments in actual engineering. [0003] At present, there are three ...

Claims

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Application Information

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IPC IPC(8): G06F17/50
CPCG06F30/23G06F30/333
Inventor 于亚婷高宽厚袁飞李延斌叶朋鑫田贵云杜平安
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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