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X-ray grating phase contrast imaging automatic calibration system and method

A phase-contrast imaging and automatic calibration technology, which is applied in the direction of material analysis using radiation, material analysis using wave/particle radiation, instruments, etc., can solve the problems of affecting experimental efficiency and long adjustment time, so as to improve experimental efficiency, Reduce the workload and reduce the effect of human eye error

Active Publication Date: 2020-06-16
SHENZHEN INST OF ADVANCED TECH
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Problems solved by technology

In fact, even experienced experimenters spend a lot of time adjusting the optical path each time, which greatly affects the efficiency of the experiment

Method used

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  • X-ray grating phase contrast imaging automatic calibration system and method
  • X-ray grating phase contrast imaging automatic calibration system and method

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Embodiment Construction

[0019] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.

[0020] refer to figure 1 Shown is a hardware architecture diagram of the X-ray grating phase-contrast imaging automatic calibration system of the present invention.

[0021] The system includes a computer 101 , a COM module 102 , a motion control module 103 , an X light source 104 , a source grating 105 , a beam splitting grating 106 , a sample stage 107 , an analysis grating 108 , a detector 109 and an image transmission module 110 . Wherein: X light source 104, source grating 105, beam splitting grating 106, sample stage 107, analysis grating 108 and detector 109 are located in the center of the same optical path, COM module 102 is electrically connected with computer 101, motion control module 103, image transmission module 110 respectively Connection; the motion control module 103 is electrically connected to the X light source 1...

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Abstract

The invention relates to an automatic calibration method for X-ray grating phase-contrast imaging, comprising: moving a sample stage so that the sample stage is not on the optical path; X-rays emitted by an X-ray source form a fringe image on a detector; analyzing and obtaining the parameters of the fringe image ; Judging whether the parameters of the fringe image match the parameters of the first standard image; if the match is successful, the sample stage is moved back to the optical path, and the sample is placed on the sample stage; forming a shadow image; analyzing the parameters of the shadow image; judging whether the parameters of the shadow image match the parameters of the second standard image; if the matching is successful, then completing the automatic calibration. The invention also relates to an automatic calibration system for X-ray grating phase contrast imaging. The invention can complete the automatic calibration of the grating phase contrast, reduce the workload of manual adjustment, improve the experimental efficiency and reduce the error of human eyes.

Description

technical field [0001] The invention relates to an automatic calibration system and method for X-ray grating phase contrast imaging. Background technique [0002] In the field of X-ray grating phase-contrast imaging, grating phase-contrast imaging uses a common X light source, which greatly reduces the cost of the experiment. Therefore, it is considered to be a technical means closest to practical application. There are as many as three gratings on the entire optical path of this technology, and the phase contrast imaging technology is extremely sensitive to the optical path, requiring a very precise optical path. [0003] The traditional method is: place the optical components on the translation (XYZ direction), rotation and deflection platform, connect the motion controller and COM module, and manually operate the computer to regulate the optical path. However, the entire optical table has many components, and precise optical adjustment is prone to errors and is very time...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/04G06K9/62
CPCG01N23/04G01N2223/1016G01N2223/3037G01N2223/426G06F18/22
Inventor 李文超陈鸣闽李凌李志成辜嘉
Owner SHENZHEN INST OF ADVANCED TECH
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